EWMA Control Charts for Monitoring High Yield Processes

References

• Balakrishnan , N. , Koutras , M. V. ( 2002 ). Runs and Scans with Applications . New York : Wiley .
   Google Scholar
• Bourke , P. D. ( 1991 ). Detecting a shift in the fraction of nonconforming items using run-length control charts with 100% inspection . J. Qual. Technol. 23 : 225 – 238 .
   Web of Science ®Google Scholar
• Brook , D. , Evans , D. A. ( 1972 ). An approach to the probability distribution of CUSUM run length . Biometrika 59 : 539 – 549 .
   Web of Science ®Google Scholar
• Calvin , T. W. ( 1983 ). Quality control techniques for “zero defects” . IEEE Trans. Compon. Hybrids Manufact. Technol. 6 : 323 – 328 .
   Web of Science ®Google Scholar
• Chang , T. C. , Gan , F. F. ( 2001 ). Cumulative sum charts for high yield processes . Statistica Sinica 11 : 791 – 805 .
   Web of Science ®Google Scholar
• Farmakis , N. (2003). Estimation of coefficient of variation: scaling of symmetric continuous distributions. Statist. Transit. 6(1):83–96.
   Google Scholar
• Goh , T. N. ( 1987 ). A control chart for very high yield processes . Qual. Assur. 13 : 18 – 22 .
   Google Scholar
• Koutras , M. V. , Bersimis , S. , Maravelakis , P. E. ( 2007 ). Statistical process control using shewhart control charts with supplementary runs rules . Methodol. Comput. Appl. Probab. 9 : 207 – 224 .
   Web of Science ®Google Scholar
• Lucas , J. M. , Crosier , R. B. ( 1982 ). Fast initial response for CUSUM quality control schemes: give your CUSUM a head start . Technometrics 24 : 199 – 205 .
   Web of Science ®Google Scholar
• Lucas , J. M. , Saccucci , M. S. ( 1990 ). Exponentially weighted moving average control schemes: properties and enhancements . Technometrics 32 : 1 – 12 .
   Web of Science ®Google Scholar
• Montgomery , D. C. ( 2005 ). Introduction to Statistical Quality Control. , 5th ed. New York : Wiley .
   Google Scholar
• McCool , J. I. , Motley , T. J. ( 1998 ). Control charts applicable when the fraction nonconforming is small . J. Qual. Technol. 30 : 240 – 247 .
   Web of Science ®Google Scholar
• Nelson , L. S. ( 1994 ). A control chart for parts-per-million nonconforming items . J. Qual. Technol. 26 : 239 – 240 .
   Web of Science ®Google Scholar
• Quesenberry , C. P. ( 1995 ). Geometric Q charts for high quality processes (with discussion) . J. Qual. Technol. 27 : 701 – 719 .
   Google Scholar
• Roberts , S. W. ( 1959 ). Control chart tests based on geometric moving averages . Technometrics 1 : 239 – 250 .
   Google Scholar
• Shu , L. J. , Jiang , W. , Wu , S. J. ( 2007 ). A one-sided EWMA control chart for monitoring process mean . Commun. Statist. Simul. Computat. 36 : 901 – 920 .
   Web of Science ®Google Scholar
• Yeh , A. B. , Mcgrath , R. N. , Sembower , M. A. ( 2008 ). EWMA control charts for monitoring high-yield processes based on non-transformed observations . Int. J. Product. Res. 46 : 5679 – 5699 .
   Web of Science ®Google Scholar
• Woodall , W. H. , Mahmoud , M. A. ( 2005 ). The inertia problem of quality control charts . Technometrics 47 : 425 – 436 .
   Web of Science ®Google Scholar
• Wu , C. C. , Tang , G. R. ( 1998 ). Tolerance design for products with asymmetric quality losses . Int. J. Product. Res. 36 : 2592 – 2541 .
   Web of Science ®Google Scholar