Bibliography
- David , H.A. 1981 . Order Statistics , New York : John Wiley .
- Diciccio , T.J. 1987 . Approximate inference for the generalized gamma distribution . Technometrics , 29 : 33 – 40 .
- Govindarajulu , Z. and Joshi , M. 1968 . Best linear unbiased estimation of location and scale parameters of Weibull distribution using order observations . Rep. Stat. Appl. Res. JOSE , 15 : 1 – 14 .
- Gupta , A.K. 1952 . Estimation of the mean and standard deviation of a normal population from a censored sample . Biometrika , 39 : 260 – 273 .
- Gupta , S.S. 1960 . Order statistics from the gamma distribution . Technometrics , l2 : 243 – 262 .
- Harter , H.L. 1967 . Maximum likelihood estimation of the parameters of a four-parameter generalized gamma population from complete and censored samples . Technometrics , 9 : 159 – 165 .
- Kantam , R.R.L. 1988 . Some Contributions to Gamma and Related Models , INDIA : Nagarjuna University . Unpublished Ph.D.Thesis
- Kantam , R.R.L. and Narasimham , V.L. 1990 . Linear estimation in reflected gamma distribution . Sankhya , B to appear in
- Krishnaiah , P.R. and Rizvi , M.H. 1967 . A note on moments of gamma order statistics . Technometrics , 9 : 315 – 318 .
- Lawless , J.F. 1980 . Inference in the generalized gamma and log-gamma distributions . Technometrics , 22 : 409 – 419 .
- Lieblein , J. 1955 . On moments of order statistics from the Weibull distribution . Ann. Math. Statist , 34 : 330 – 333 .
- Lloyd , E.H. 1952 . Least squares estimation of location and scale parameters using order statistics . Biometrika , 39 : 88 – 95 .
- Prescott , P. 1974 . Variances and covariance of order statistics from the gamma distribution . Biometrika , 61 : 607 – 613 .
- Sarhan , A.E. and Greenberg , B.G. 1957 . Tables for the best linear estimates by order statistics of the parameters of single exponential distribution from singly and doubly censored samples . J. Amer. Statist. Assoc , 52 : 50 – 87 .
- Stacy , E.W. and Mihram , G.A. 1965 . Parameter estimation for a generalized gamma distribution . Technometrics , 7 : 349 – 358 .