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Articles

Study of Short-range Ordering in Amorphous and Nanocrystalline Materials from Laboratory based Pair Distribution Function (LPDF)

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Pages 158-165 | Received 26 Jan 2020, Accepted 22 Jun 2020, Published online: 23 Sep 2020

References

  • A. Guinier, X-ray Diffraction in Crystals, Imperfect Crystals and Amorphous Bodies, W. H. Freeman and Company, San Francisco, USA (1963).
  • B. E. Warren, X-ray Diffraction , Addison W esley, Massachusetts, USA (1969).
  • B. D. Cullity, Elements of X-ray Diffraction, Addison-Wesley, New York, USA (1959).
  • A. K. Singh, Advanced X-ray Techniques in Research and Industry, ISBN 1-58603-537-1, IOS Press, Amsterdam, The Netherlands (2005).
  • H. P. Klug and L. E. Alexander, X-ray Diffraction Procedures: For Polycrystalline and Amorphous Materials , Wiley, New York, USA (1974).
  • H. M. Rietveld, J. Appl. Cryst., 2, 65–71 (1969).
  • R. A. Young, The Rietveld Method, International Union of Crystallography, Oxford Science Publications, Oxford, UK (1996).
  • Y. T. Cheng and W. L. Johnson, Science, 235, 997–1002 (1987).
  • G. S. Henderson and D. R. Neuville, Am. Miner., 93, 1485–1485 (2008).
  • Z. H. Stachurski, Materials, 4, 1564–1598 (2011).
  • K. R. Priolkar, Trans. Indian Ceram. Soc., 76, 85–96 (2017).
  • T. Egami and S. J. L. Billinge, Underneath the Bragg Peaks: Structural Analysis of Complex Materials, 2nd edition, Elsevier Science B.V., Amsterdam, The Netherlands (2003).
  • S. J. L. Billinge, Z. Kristallogr., 219, 117–121 (2004).
  • Th. Proffen, S. J. L. Billinge, T. Egami and D. Louca, Z. Kristallogr., 218, 132–143 (2003).
  • S. J. L. Billinge, “Pair Distribution Function Technique: Principles and Methods”, pp. 183-193 in: Uniting Electron Crystallography and Powder Diffraction, NATO Science for Peace and Security Series B: Physics and Biophysics, Eds. U. Kolb, K. Shankland, L. Meshi, A. Avilov and W. David, Springer, Dordrecht, The Netherlands (2012).
  • T. Wieder and H. A. Fuess, Z. Naturforsch., 52a, 386-392 (1997).
  • P. Scardi, S. J. L. Billinge, R. Neder and A. Cervellino, Acta Cryst., A72, 589-590 (2016).
  • C. A. Reiss, A. Kharchenko and M. Gateshki, Z. Kristallogr., 227, 257–261 (2012).
  • J. Nijenhuis, M. Gateshki and M. J. Fransen, Z. Kristallogr. Suppl., 30, 163–169 (2009).
  • S. L. J. Thomae, N. Prinz, T. Hartmann, M. Teck, S. Correll and M. Zobel, Rev. Sci. Instrum., 90, 043905 (2019).
  • R. K. Biswas, P. Khan, A. K. Mukhopadhyay, J. Ghosh and K. Muraleedharan, Acta Cryst., A73, C885 (2017).
  • Th. Proffen, K. L. Page, S. E. Mc Lain, B. Clausen, T. W. Darling, J. A. Ten Cate, Y. Lee and E. Ustundag, Z. Kristallogr., 220, 1002–1008 (2005).
  • S. J. L. Billinge, Phil. Trans. R. Soc. A, 377, 20180413 (2019).
  • A. P. Hammersley, J. Appl. Crystallogr., 49, 646–652 (2016).
  • V. Petkov, J. Appl. Cryst., 22, 387–389 (1989).
  • X. Qiu, J. W. Thompson and S. J. L. Billinge, J . Appl. Crystallogr., 37, 678–678 (2004).
  • P. Juhas, T. Davis, C. L. Farrow and S. J. L. Billinge, J. Appl. Cryst., 46, 560–566 (2013).
  • C. L. Farrow, P. Juhas, J. W. Liu, D. Bryndin, E. S. Bozin, J. Bloch, Th. Proffen and S. J. L. Billinge, J. Phys.: Condens. Matter., 19, 335219 (2007).
  • D. Ganguli, Trans. Indian Ceram. Soc., 68, 65–80 (2009).
  • R. L. Mozzi and B. E Warren, J. Appl. Cryst., 2, 164–172 (1969).
  • R. K. Biswas, P. Khan, S. Mukherjee, A. K. Mukhopadhyay, J. Ghosh and K. Muraleedharan, J. Non-Cryst. Solids, 488, 1–9 (2018).
  • A. Tarafder, B. Karmakar and A. R. Molla, Trans. Indian Ceram. Soc., 77, 12–19 (2018).
  • B. K. Barkey, S. S. Das, A. Meher and P. Saha, Trans. Indian Ceram. Soc., 76, 21–30 (2017).
  • R. H. Stolen and G. E. Walrafen, J. Chem. Phys., 64, 2623–2631 (1976).
  • R. H. Stolen, J. T. Krause and C. R. Kurkjian, Discuss. Faraday Soc., 50, 103–107 (1970).
  • J. C. Mikkelsen and F. L. Galeener, J. Non-Cryst. Solids, 37, 71–84 (1980).

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