REFERENCES
- Berman, R., Advances in Physics, Vol. 2, (Taylor & Francis Ltd., England), 1953, 103.
- Cohen, A. F., Low Temperature Physics and Chemistry, edited by J. R. Dellinger (University of Wisconsin Press, Madison), 1958, 358.
- Van Dyken A. R., Bowman, M. G., Neubert, T. J. & Novick, A., J. appl Phys., 27 (1956), 570.
- Pearlman, N., Methods of experimental pyhsics, Vol. 6 A edited by K. Lark-Horovitz & V. A. Johsnon (Academic Press, New York), 1959, 388.
- Mielczarek, E. V. & Frederiks, H. P. R., Phys. Rev., 115 (1959), 888.
- Goldsmid, H. J., Proc. phys. Soc., B69 (1956), 203.
- Satterthwaite, C. B. & Ure, R., Phys. Rev., 108 (1957), 1164.
- Busch, G., Steigmeier, E. & Wettstein, E., Helv. phys. acta, 32 (1959), 463.
- Abeles, B., J. phys. Chem. Solids, 8 (1959), 340.
- Kettel, F., J. phys. Chem. Solids, 10 (1959), 52.
- Kingery, W. D., J. Amer. Cer. Soc., 37 (1954), 88.
- Stucks, A. D. & Chasmer, R. P., Report of the Meeting on Semiconductors, Physical Society, London, 1956, 119.
- Stucks, A. D., Phil. Mag., 5 (1960), 84.
- Morris, R. G. & Hust, I. G., Phys. Rev., 124 (1961), 1426.
- Reinderer, L. A., Diplomarbeit, Swiss Federal Inst, of Technology, Zurich, 1962.
- Ioffe, A. V. & Ioffe, A. F., Zh. Tekh. Fiz., 22 (1952), 2005.
- Kagnov, M. A., Zh. Tekh. Fiz., 28 (1958), 2364.
- Dauphinee, T. M., Canad. J. Phys., 31 (1953), 577.