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Original Articles

Notch Filter Characteristics of Distributed Parameter C-R-NC Structures

Pages 275-280 | Received 01 Apr 1976, Published online: 11 Jul 2015

REFERENCE

  • Castro (PS). Microsystem Circuit Analysis. Elect. Engg 80, 7; 1961; 535–542.
  • Woo (BB) and Bartlemay (JM). Characteristics and Applications of a Tapered, Thin-Film Distributed Parameter Structures. IEEE International Convention Record. 11, II; 1963; 56–75.
  • Bowron (P), HOLT (AGJ) and Stokes (D). Inhomogeneous Distributed C-R-NC Structures. Int. J. Electronics. 28, 3; 1970; 197–213.
  • Castro (PS) and Happ (WW). Distributed Parameter circuits and Microsystem Electronics. Proc. National Electronics Conference. 16, 1960; 448–460.
  • Castro (PS) and Happ (WW). Subnetworks. IRE Inter national Conference Record. 10, 2; 1962; 3–7.
  • Kleinheins (S). Steepness of an Exponentially Tapered Distributed RC Notch Filters. Electronics Letters. 2, 1966; 262–263

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