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IETE Journal of Research Volume 33, 1987 - Issue 3

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Letters to the Editor

On the Syndrome Testing of ‘Syndrome Untestable’ Combinational Circuits by the Addition of Extra Observation Points

Indranil Sen GuptaDepartment of Computer ScienceUniversity College of Technology 92, Acharya Prafulla Chandra Road Calcutta700009India

Pages 97-98 | Received 11 Dec 1986, Published online: 02 Jun 2015

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https://doi.org/10.1080/03772063.1987.11436672

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REFERENCES

J Savir, Syndrome-testable design of combinational circuits, IEEE Trans, vol C-29, pp 442–451, Jun 1980
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J Savir, Syndrome-testing of syndrome-untestable combinational circuits, ibid, vol C-30, pp 606–608, Aug 1981
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G Markowsky, Syndrome-testability can be achieved by circuit modification, IEEE Trans, vol C-30, pp 604–606, Aug 1981
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