REFERENCES
- J Savir, Syndrome-testable design of combinational circuits, IEEE Trans, vol C-29, pp 442–451, Jun 1980
- J Savir, Syndrome-testing of syndrome-untestable combinational circuits, ibid, vol C-30, pp 606–608, Aug 1981
- G Markowsky, Syndrome-testability can be achieved by circuit modification, IEEE Trans, vol C-30, pp 604–606, Aug 1981