6
Views
1
CrossRef citations to date
0
Altmetric
Original Articles

Use of synchrotron diffraction data for describing crystal structure and crystallographic phase analysis of R-phase NiTi shape memory alloy

Pages 185-195 | Received 13 Sep 2003, Published online: 13 May 2010

References

  • Bunge H.-J. 1982 Texture Analysis in Materials Science: Mathematical Methods translated by P.R. Morris Butterworths London
  • Choi , C.S. , Baker , E.F. and Orosz , J. 1993 . Application of ODF to the Rietveld profile refinement of polycrystalline solid . Adv. X-ray Analysis , 37 : 49 – 57 .
  • Dollase , W.A. 1986 . Correction of intensities for preferred orientation in powder diffractometry: application of the March model . J. Appl. Cryst. , 19 : 267 – 272 .
  • Ferrari , M. and Lutterrotti , L. 1994 . Method for simultaneous determination of anisotropic residual stresses and texture by X-ray diffraction . J. Appl. Phys. , 76 : 7246 – 7255 .
  • Hara , T. , Ohba , T. , Okunishi , E. and Otsuka , K. 1997 . Structural study of R-phase in Ti-50.75 at.% and Ti-47.75at.%Ni-1.50at.%Fe alloys . Mater. Trans. JIM , 38 : 11 – 17 .
  • Hara , T. , Ohba , T. and Otsuka , K. 1995 . Structural study of the R-phase in Ti-Ni alloy by the Rietveld method . J. de Physique III , 5 : 641 – 645 .
  • Larson A.C. Von Dreele R.B. 2000 General Structure Analysis System (GSAS) 86 748 Los Alamos National Laboratory, Report LAUR
  • Lutterotti , L. , Matthies , S. , Wenk , H.-R. , Schultz , A.S. and Richardson , J.W. Jr . 1997 . Combined texture and structure analysis of deformed limestone from time-of-flight neutron diffraction spectra . J. Appl. Phys. , 81 : 594 – 600 .
  • March , A. 1932 . Mathematische Theorie der Regelung nach der Korngestalt bei affiner Deformation . Z. Kristallogr , 81 : 285 – 297 .
  • Otsuka K. Wayman C.M. 1998 Shape Memory Materials Cambridge University Press Cambridge
  • Popa , N.C. 1992 . Texture in Rietveld refinement . J. Appl. Cryst. , 25 : 611 – 616 .
  • Popa , N.C. 1998 . The (hkl) dependence of diffraction-line broadening caused by strain and size for all Laue groups in Rietveld refinement . J. Appl. Cryst. , 31 : 176 – 180 .
  • Rietveld , H.M. 1969 . A profile refinement method for nuclear and magnetic structures . J. Appl. Cryst. , 2 : 65 – 71 .
  • Schryvers , D. and Potapov , P.L. 2002 . R-phase structure refinement using electron diffraction data . Materials Trans , 43 ( 5 ) : 774 – 779 .
  • Sitepu , H. 2002 . Assessment of preferred orientation with neutron powder diffraction data . J. Appl. Cryst. , 35 : 274 – 277 .
  • Sitepu , H. , Schmahl , W.W. , Khalil Allafi , J. , Eggeler , G. , Dlouhy , A. , Reinecke , T. , Brokmeier , H.G. , Tovar , M. and Többens , D.M. 2002b . Texture and quantitative phase analysis of aged Ni-rich NiTi using X-ray and neutron diffractions . Materials Science Forum , 394–395 : 237 – 240 .
  • Sitepu , H. , Schmahl , W.W. , Khalil Allafi , J. , Eggeler , G. , Dlouhy , A. , Többens , D.M. and Tovar , M. 2002a . Neutron diffraction phase analysis during thermal cycling of a Ni-rich NiTi shape memory alloy using the Rietveld method . Scripta Mater , 46 : 543 – 548 .
  • Stephens , P.W. 1999 . Phenomenological model of anisotropic peak broadening in powder diffraction . J. Appl. Cryst. , 32 : 281 – 289 .
  • Von Dreele , R.B. 1997 . Quantitative texture analysis by Rietveld refinement . J. Appl. Cryst. , 30 : 517 – 525 .

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.