References
- Wendlandt WW, Hecht HG. Reflectance spectroscopy. New York (NY): Wiley; 1966.
- Kortum G. Reflectance spectroscopy. Berlin: Springer-Verlag; 1969.
- Hecht HG. The interpretation of diffuse reflectance spectra. J Res Natl Bureau Stand-Phys, Chem. 1976;80A(4):567–583. doi: 10.6028/jres.080A.056
- Wyszecki G, Stiles WS. Color science: concepts and methods, quantitative data and formulae. 2nd ed. New York (NY): Wiley; 1982.
- Hapke B. Introduction to the theory of reflectance and emittance spectroscopy. New York (NY): Cambridge University Press; 1993.
- Torrent J, Barron V. Diffuse reflectance spectroscopy. In: Torrent J., Borron V., editors. Methods. Madison (WI): Soil Science Society of America; 2008. p. 367–385. Chapter 13.
- Bohren CF, Huffman DR. Absorption and scattering of light by small particles. Weinheim, Germany: Wiley-VCH; 2004.
- Born M, Wolf E. Principles of optics. 2nd ed. London: Pergamon; 1964.
- Dzimbeg-Malcic V, Barbaric-Mikocevic Z, Itric K. Kubelka-Munk theory in describing optical properties of paper (I). Tech Gazette. 2011;18(1):117–124.
- Kubelka P, Munk F. Ein Beitrag zur Optik der Farbanstriche. Z Tech Phys (Leipzig). 1931;12: 593–601.
- Kubelka P. New contributions to the optics of intensely light-scattering materials. Part I. J Opt Soc Am. 1948;38:448–457. doi: 10.1364/JOSA.38.000448
- Kubelka P. New contributions to the optics of intensely light-scattering materials. Part II. J Opt Soc Am. 1954;44:330–335. doi: 10.1364/JOSA.44.000330
- Ebel S, Kang JS, Windmann W. Normalization of in situ-spectra in thin layer chromatography. In: Gasteiger J., editor. Software developments in chemistry 4. Berlin: Springer; 1990. p. 207–219. doi: 10.1007/978-3-642-75430-2_23
- Fabricolor holding international product list, laser and fluorescent dyes, UV and NIR dyes, security inks and other optically functional materials, Code FHI 97811, Code FHI 94931 and Code FHI 83642.
- American Dye Source, Inc., ADS 775PI, CAS # 207399-07-3. Baie D’Urfe, Quebec, Canada.