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Original Articles

Polarity determination in 〈100〉-orientated GaSb by high-resolution transmission electron microscopy at 300 kV

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Pages 107-111 | Received 05 Oct 1987, Accepted 09 Nov 1987, Published online: 20 Aug 2006

References

  • Glaisher , R. 1987 . Microscopy of Semiconducting Materials , Institute of Physics Conference Series 87 Edited by: Cullis , A. G. and Augustus , P. D. Bristol : Institute of Physics .
  • O'Keefe , M. A. , Buseck , P. R. and Iijima , S. 1978 . Nature, Lond. , 274 : 322
  • Ourmazd , A. 1987 . Proceedings of the 14th International Conference on Defects in Semiconductors . 1987 , Paris. pp. 1 – 10 .
  • Pettit , H. R. and Booker , G. R. 1971 . EMAG Conference Proceedings . 1971 . pp. 290 Bristol : Institute of Physics .
  • Tafto , J. and Spence , J. H. C. 1982 . J. appl. Crystallogr. , 15 : 60

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