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Philosophical Magazine Letters Volume 71, 1995 - Issue 6
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Original Articles

Electron microscopy of grain boundaries: An application to RE-Fe-B (RE = Pr or Nd) magnetic materials

Yimei Zhu Materials Science Division, Department of Applied Science, Brookhaven National Laboratory, Upton, New York, 11973, USA
,
J. Tafto Materials Science Division, Department of Applied Science, Brookhaven National Laboratory, Upton, New York, 11973, USA; Department of Physics, University of Oslo, Blindern, Norway
,
L. H. Lewis Materials Science Division, Department of Applied Science, Brookhaven National Laboratory, Upton, New York, 11973, USA
&
D. O. Welch Materials Science Division, Department of Applied Science, Brookhaven National Laboratory, Upton, New York, 11973, USA
Pages 297-305 | Received 13 Feb 1995, Accepted 27 Feb 1995, Published online: 27 Sep 2006

References

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  • Zhu , Y. , Zhang , H. , Suenaga , M. and Welch , D. O. 1993 . Phil. Mag. A , 68 : 1079

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