Sin² ψ stress measurement method with maintaining probing depth

Etsuya Yanase New Industry Research Organization, Kobe, Japan

Konstantin Vladlmirovich Zolotarev New Industry Research Organization, Kobe, Japan

Kozi Nishio New Industry Research Organization, Kobe, Japan

Yukihiro Kusumi New Industry Research Organization, Kobe, Japan

Kazuo Arai New Industry Research Organization, Kobe, Japan

Shigetomo Nakagawa Akashi Technical Institute, Kawasaki Heavy Industries, Ltd, Japan

References

Reimers , W. 1998 . Evaluation of residual stresses in the bulk of materials by high energy synchrotron diffraction . J. Nondestr. Eval. , 17 : 129
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Paul Predecki , L. 1993 . Proposed methods for depth profiling of residual stresses using grazing incidence X-ray diffraction (GIXD) . Adv. X-ray Anal. , 36 : 237
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Fischer , K. 1996 . Analysis of residual stress gradients in thin films using SEEMANN BOHLIN X-ray diffraction . Mater. Sci. Forum , 228/231 : 301
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Yoshioka , Y. 2000 . “ Residual stress and its gradient in shot-penned steels measured by synchrotron radiation X-rays ” . In Proceedings of the ICRS 6 1020 Oxford, United Kingdom
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Sin2 ψ stress measurement method with maintaining probing depth

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Sin² ψ stress measurement method with maintaining probing depth