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Radiation Effects and Defects in Solids
Incorporating Plasma Science and Plasma Technology
Volume 170, 2015 - Issue 10
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Original Articles

Effects of packing materials on the sensitivity of RadFET with HfO2 gate dielectric for electron and photon sources

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Pages 832-844 | Received 17 Apr 2015, Accepted 02 Nov 2015, Published online: 17 Dec 2015

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