Low dose ⁶⁰Co gamma-irradiation effects on electronic carrier transport and DC characteristics of AlGaN/GaN high-electron-mobility transistors

References

• Ionascut-Nedelcescu, A., Carlone, C.; Houdayer, A.; von Bardeleben, H.J.; Cantin, J.-L.; Raymond, S. IEEE Trans. Nucl. Sci. 2002, 49, 2733–2738.
   Web of Science ®Google Scholar
• Wu, Y.-F.; Kapolnek, D.; Ibbetson, J.P.; Parikh, P.; Keller, B.P.; Mishra, U.K. IEEE Trans. Electron Devices 2001, 48 (3), 586–590.
   Web of Science ®Google Scholar
• Mishra, U.K.; Shen, L.; Kazior, T.E.; Wu, Y.-F. Proc. IEEE 2008, 96 (2), 287–305.
   Web of Science ®Google Scholar
• Schlotter, P., Schmidt, R.; Schneider, J. Appl. Phys. A: Mater. Sci. Process. 1997, 64 (4), 417–418.
   Web of Science ®Google Scholar
• Akasaki, I.; Amano, H.; Nakamura, S. Efficient Blue Light-Emitting Diodes Leading to Bright and Energy-Saving White Light Sources, The 2014 Nobel Prize in Physics Press Release.
   Google Scholar
• Pearton, S.J.; Deist, R.; Ren, F.; Liu, L.; Polyakov, A.Y.; Kim, J. J. Vacuum Sci. Technol. A 2013, 31 (5), 050801.
   Web of Science ®Google Scholar
• Bogorad, A.L.; Likar, J.J.; Moyer, S.K.; Ditzler, A.J.; Doorley, G.P.; Herschitz, R. IEEE Radiat. Effects Data Workshop 2008, 124–130.
   Google Scholar
• Polyakov, A.Y.; Pearton, S.J.; Frenzer, P.; Ren, F.; Liu, L.; Kim, J. J. Mater. Chem. C 2013, 1 (5), 877–887.
   Web of Science ®Google Scholar
• Pearton, S.J.; Polyakov, A.Y. Int. J. Mater. Struct. Integrity 2008, 2 (1–2), 93–105.
   Google Scholar
• Schwarz, C.; Yadav, A.; Shatkhin, M.; Flitsiyan, E.; Chernyak, L.; Kasiyan, V.; Liu, L.; Xi, Y.Y.; Ren, F.; Pearton, S.J. Appl. Phys. Lett. 2013, 102 (6), 062102.
   Web of Science ®Google Scholar
• Reshchikov, M.A.; Morkoc, H. J. Appl. Phys. 2005, 97 (6), 061301.
   Web of Science ®Google Scholar
• Look, D.C.; Reynolds, D.C.; Hemsky, J.W.; Sizelove, J.R.; Jones, R.L.; Molnar, R.J. Phy. Rev. Lett. 1997, 79 (12), 2273.
   Web of Science ®Google Scholar
• Amano, H.; Kito, M.; Hiramatsu, K.; Akasaki, I. Jpn. J. Appl. Phys. 1989, 28 (12A), L2112.
   Google Scholar
• Yadav, A.; Flitsiyan, E.; Chernyak, L.; Hwang, Y.-H.; Hsieh, Y.-L.; Lei, L.; Ren, F.; Pearton, S.J.; Lubomirsky, I. Radiat. Effects Defects Solids 2015, 170 (5), 377–385.
   Web of Science ®Google Scholar
• Hwang, Y.-H.; Hsieh, Y.-L.; Lei, L.; Li, S.; Ren, F.; Pearton, S.J.; Yadav, A.; Schwarz, C.; Shatkhin, M., Wang, L. J. Vacuum Sci. Technol. B 2014, 32 (3), 031203.
   Web of Science ®Google Scholar
• Lu, L., Ya-Hsi, H., Yuyin, X., Fan, R., Valentin, C., Pearton, S.J., Yang, G., Kim, H.-Y., Kim, J. J. Vacuum Sci. Technol. B 2014, 32 (2), 022202, 1–6.
   Google Scholar
• Ehmann, W.D.; Vance, D.E. Radiochemistry and Nuclear Methods of Analysis; Wiley: New York, 1991, 162–175.
   Google Scholar
• Nelson, G.; Reilly, D. Gamma-Ray Interactions with Matter. Passive Nondestructive Analysis of Nuclear Materials; Los Alamos National Laboratory, NUREG/CR-5550, LA-UR-90-732, 1991; pp 27–42.
   Google Scholar
• Umana-Membreno, G.A.; Dell, J.M.; Hessler, T.P.; Nener, B.D.; Parish, G.; Faraone, L.; Mishra, U.K. Appl. Phys. Lett. 2002, 80 (23), 4354–4356.
   Web of Science ®Google Scholar
• Bandić, Z.Z.; Bridger, P.M.; Piquette, E.C.; McGill, T.C. Appl. Phys. Lett. 1998, 72 (24), 3166–3168.
   Web of Science ®Google Scholar
• Chernyak, L., Osinsky, A.; Schulte, A. Solid-State Electron. 2001, 45 (9), 1687–1702.
   Web of Science ®Google Scholar
• Yadav, A.; Glasscock, C.; Flitsiyan, E.; Chernyak, L.; Lubomirsky, I.; Khodorov, S.; Salzman, J.; Meyler, B.; Coppola, C.; Guay, S. Radiat. Effects Defects Solids 2016, 171 (3,4), 223–230.
   Web of Science ®Google Scholar
• Kurakin, A.M.; Vitusevich, S.A.; Danylyuk, S.V.; Hardtdegen, H.; Klein, N.; Bougrioua, Z.; Danilchenko, B.A.; Konakova, R.V.; Belyaev, A.E. J. Appl. Phys. 2008, 103 (8), 083707.
   Web of Science ®Google Scholar
• Vitusevich, S.A.; Klein, N.; Belyaev, A.E.; Danylyuk, S.V.; Petrychuk, M.V.; Konakova, R.V.; Kurakin, A.M.; Rengevich, A.E.; Avksentyev, A.Yu.; Danilchenko, B.A. Phys. Status Solidi (a) 2003, 195 (1), 101–105.
   Web of Science ®Google Scholar
• Aktas, O.; Kuliev, A.; Kumar, V.; Schwindt, R.; Toshkov, S.; Costescu, D.; Stubbins, J.; Adesida, I. Solid-State Electron. 2004, 48 (3), 471–475.
   Web of Science ®Google Scholar
• Oh, S.K.; Song, C.G.; Jang, T.; Kwak, J.S. J. Semicond. Technol. Sci. 2013, 13 (6), 617–621.
   Web of Science ®Google Scholar
• Oh, S.K.; Song, C.G.; Jang, T.; Kim, K.-C.; Jo, Y.J.; Kwak, J.S. J. Nanosci. Nanotechnol. 2013, 13 (3), 1738–1740.
   PubMed Web of Science ®Google Scholar
• Luo, B.; Johnson, J.W.; Ren, F.; Allums, K.K.; Abernathy, C.R.; Pearton, S.J.; Dabiran, A.M.; Wowchack, A.M.; Polley, C.J.; Chow, P.P. Appl. Phys. Lett. 2002, 80 (4), 604–606.
   Web of Science ®Google Scholar
• Patrick, E.E.; Choudhury, M.; Ren, F.; Pearton, S.J.; Law, M.E. ECS J. Solid State Sci. Technol. 2015, 4 (3), Q21–Q25.
   Web of Science ®Google Scholar