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Radiation Effects and Defects in Solids
Incorporating Plasma Science and Plasma Technology
Volume 174, 2019 - Issue 3-4
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Articles

Effect of elevated temperature irradiation on bipolar devices for space application

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Pages 320-328 | Received 14 Apr 2018, Accepted 28 Dec 2018, Published online: 14 Mar 2019

References

  • Pease, R.L.; Schrimpf, R.D.; Fleetwood, D.M. IEEE Trans. Nucl. Sci. 2009, 56 (4), 1894–1908. doi: 10.1109/TNS.2008.2011485
  • Fleetwood, D.M.; Kosier, S.L.; Nowlin, R.N.; Schrimpf, R.D.; Reber, R.A. Jr.; DeLaus, M.; Winokur, P.S.; Wei, A.; Combs, W.E.; Pease, R.L. IEEE Trans. Nucl. Sci. 1994, 41 (6), 1871–1883. doi: 10.1109/23.340519
  • Witczak, S.C.; Schrimpf, R.D.; Galloway, K.F.; Fleetwood, D.M.; Pease, R.L.; Puhl, J.M.; Schmidt, D.M.; Combs, W.E.; Suchle, J.S. IEEE Trans. Nucl. Sci. 1996, 43 (6), 3151–3160. doi: 10.1109/23.556919
  • Li, X.; Lu, W.; Wang, X.; Guo, Q.; Yu, X.; He, C.; Sun, J.; Liu, M.; Yao, S.; Wei, X. Radiat. Eff. Def. Solids 2017, 172 (11-12), 824–834. doi: 10.1080/10420150.2017.1411354
  • Pershenkov, V.S.; Savchenkov, D.V.; Bakerenkov, A.S.; Ulimov, V.N.; Nikiforov, A.Y.; Chumakov, A.I.; Romanenko, A.A. The Conversion Model of low Dose Rate Effect in Bipolar Transistors. RADECS Proceeding, 2009, 286–393.
  • Pershenkov, V.S.; Savchenkov, D.V.; Bakerenkov, A.S.; Ulimov, V.N. Russ. Microlectron. 2010, 39 (2), 91–99. doi: 10.1134/S1063739710020046
  • McLean, F.B. IEEE Trans. Nucl. Sci. 1980, 27 (6), 1651–1657. doi: 10.1109/TNS.1980.4331084
  • Oldham, T.R.; McLean, F.B. IEEE Trans. Nucl. Sci. 2003, 50 (3-4), 483–499. doi: 10.1109/TNS.2003.812927
  • Lai, S.K. J. Appl. Phys. 1983, 54, 2540. doi: 10.1063/1.332323
  • Sabnis, A.G. IEEE Trans. Nucl. Sci. 1983, 30 (6), 4094–4099. doi: 10.1109/TNS.1983.4333088
  • Sogoyan, A.V.; Cherepko, S.V.; Pershcnkov, V.S.; Rogov, V.I.; Ulinov, V.N.; Emelianov, V.V. RADECS Proc, 1997, 69–72.
  • Sogoyan, A.V.; Cherepko, S.V.; Pershenkov, V.S. Russ. Microlectron. 2014, 43 (2), 162–164. doi: 10.1134/S1063739714020103
  • Emelianov, V.V.; Sogoyan, A.V.; Meshurov, O.V.; Ulimov, V.N.; Pershenkov, V.S. IEEE Trans. Nucl. Sci. 1996, 43 (6), 2572–2578. doi: 10.1109/23.556838
  • Bakerenkov, A.S.; Belyakov, V.V.; Pershenkov, V.S.; Romanenko, A.A.; Savchenkov, D.V.; Shurenkov, V.V. Russ. Microlectron. 2013, 42, 48–52. doi: 10.1134/S1063739712040026
  • MIL-STD-883-G, Test Method 1019.7., 2006.

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