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Radiation Effects and Defects in Solids
Incorporating Plasma Science and Plasma Technology
Volume 174, 2019 - Issue 3-4
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Articles

Simulation of the interaction between an edge dislocation and ⟨111⟩ interstitial dislocation loops in α-iron

Panagiotis GrammatikopoulosMaterials Science and Engineering, Department of Engineering, The University of Liverpool, Liverpool, UKCorrespondence[email protected]
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,
David J. BaconMaterials Science and Engineering, Department of Engineering, The University of Liverpool, Liverpool, UKView further author information
&
Yuri N. OsetskyMaterials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USAView further author information
Pages 329-338 | Received 18 Sep 2018, Accepted 27 Dec 2018, Published online: 17 Mar 2019

References

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  • Lehtinen, A.; Granberg, F.; Laurson, L.; Nordlund, K.; Alava, M.J. Phys. Rev. E. 2016, 93, 013309. doi: 10.1103/PhysRevE.93.013309
  • Bygmästar, J.; Granberg, F.; Nordlund, K. Phys. Rev. Mater. 2017, 1, 053603. doi: 10.1103/PhysRevMaterials.1.053603
  • Lehtinen, A.; Laurson, L.; Granberg, F.; Nordlund, K.; Alava, M.J. Sci. Rep. 2018, 8, 6914. doi: 10.1038/s41598-018-25285-z
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  • Bacon, D.J.; Osetsky, Y.N.; Rodney, D. In Dislocations in Solids; Hirth, J.P., Kubin, L., Eds.; Elsevier: Amsterdam, 2009; Vol. 15.
  • Ackland, G.J.; Bacon, D.J.; Calder, A.F.; Harry, T.J. Phil. Mag. A. 1997, 75, 713. doi: 10.1080/01418619708207198
  • Terentyev, D.; Malerba, L.; Bacon, D.J.; Osetsky, Y.N. J. Phys. Condens. Matter. 2007, 19, 456211. doi: 10.1088/0953-8984/19/45/456211
  • Ackland, G.J.; Mendelev, M.I.; Srolovitz, D.J.; Han, S.; Barashev, A.V.J. J. Phys. Condens Matter. 2004, 16, S2629. doi: 10.1088/0953-8984/16/27/003
  • Osetsky, Y.N.; Bacon, D.J. Modell. Simul. Mater. Sci. Eng. 2003, 11, 427. doi: 10.1088/0965-0393/11/4/302
  • Hull, D.; Bacon, D.J. Introduction to Dislocations; Butterworth-Heinemann: Oxford, 2001.
  • Terentyev, D.; Bacon, D.J.; Osetsky, Y.N. J. Phys. Condens. Matter. 2008, 20, 445007. doi: 10.1088/0953-8984/20/44/445007
  • Ghoniem, N.M.; Busso, E.P.; Kioussis, N.; Huang, H. Phil. Mag. 2003, 83, 3475. doi: 10.1080/14786430310001607388

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