Publication Cover
Radiation Effects and Defects in Solids
Incorporating Plasma Science and Plasma Technology
Volume 128, 1994 - Issue 1-2
12
Views
13
CrossRef citations to date
0
Altmetric
Desorption

Atomic force microscopy of ultraviolet-induced surface erosion on potassium iodide

, &
Pages 79-88 | Received 03 May 1993, Published online: 19 Aug 2006

References

  • Elliot , D. J. and Townsend , P. D. 1971 . Phil. Mag. , 23 : 249
  • Szymonski , M. , Rutkowski , J. , Poradzisz , A. and Postawa , Z. 1985 . Desorption Induced by Electronic Transitions. DIET II , Edited by: Brenig , W. and Menzel , D. 160 Berlin, Heidelberg : Springer-Verlag .
  • Green , T. A. , Loubriel , G. M. , Richards , P. M. , Tolk , N. H. and Haglund , R. F. Jr. 1987 . Phys. Rev. , B35 : 781
  • Wurz , P. , Sarnthein , J. , Husinsky , W. and Betz , G. 1990 . Desorption Induced by Electronic Transitions, DIET IV , Edited by: Betz , G. and Varga , P. 289 Berlin, Heidelberg : Springer-Verlag .
  • Song , K. S. and Williams , R. T. 1993 . “ Springer Series in Solid State Sciences ” . In Self-Trapped Excitons , Vol. 105 , Berlin, Heidelberg : Springer-Verlag .
  • Puchin , V. E. , Shluger , A. L. and Itoh , N. 1993 . Phys. Rev. , B47 : 10760
  • Song , K. S. and Chen , L. F. 1994 . Radiation Effects and Defects is Solids , 128 : 1
  • Itoh , N. , Stoneham , A. M. and Harker , A. H. 1989 . Surf. Sci. , 217 : 573
  • Szymonski , M. , Kolodziej , J. , Czuba , P. , Piatkowski , P. , Poradzisz , A. , Tolk , N. H. and Fine , J. 1991 . Phys. Rev. Lett. , 67 : 1906
  • Elango , M. A. 1994 . Radiation Effects and Defects in Solids , 128 : 27
  • Green , T. A. , Loubriel , G. M. , Richards , P. M. , Hudson , L. T. , Savundararaj , P. M. , Albridge , R. G. , Barnes , A. V. and Tolk , N. H. 1990 . Desorption Induced by Electronic Transitions, DIET IV , Edited by: Betz , G. and Varga , P. 281 Berlin, Heidelberg : Springer-Verlag .
  • Dietz , P. , Ramos , C. A. and Hansma , P. K. 1992 . J. Vac. Sci. Technol. , B10 : 741
  • Meyer , E. , Heinzelmann , H. , Brodbeck , D. , Overney , G. , Overney , R. , Howald , L. , Hug , H. , Jung , T. , Hidber , H.-R. and Guntherodt , H.x-J. 1991 . J. Vac. Sci. Technol. , B9 : 1329
  • Meyer , G. and Amer , N. M. 1990 . App. Phys. Lett. , 56 : 2100
  • Williams , R. T. , Wilson , R. M. and Liu , Hanli . 1992 . Nucl. Instrum. and Meth. in Phys. Res. , B65 : 473
  • Shluger , A. L. , Wilson , R. M. and Williams , R. T. submitted for pub
  • Hutter , J. L. and Bechhoefer , J. 1993 . J. Appl. Phys. , 4123
  • Ohnesorge , F. and Binnig , G. 1993 . Science , 260 : 1451
  • Williams , R. T. , Wilson , R. M. and Williams , G. P. Jr. Desorption Induced by Electronic Transitions, DIET V , Edited by: Burns , A. R. , Stechel , E. B. and Jennison , D. R. 212 Berlin, Heidelberg : Springer-Verlag .
  • Wilson , R. M. , Williams , R. T. , Williams , G. P. Jr. and Slifkin , L. M. 1993 . Defects in Insulating Materials , Edited by: Kanert , O. and Spaeth , J.-M. 322 Singapore : World Scientific .
  • Reichling , M. , Wiebel , R. , Wilson , R. M. , Williams , R. T. and Matthias , E. 1993 . Proc. Symp. on Surface Science Kaprun, , Austria to be pub.
  • Thibaudau , F. , Cousty , J. , Balanzat , E. and Bouffard , S. 1991 . Phys. Rev. Lett. , 67 : 1582
  • Wilson , R. M. and Williams , R. T. unpublished
  • Dou , Q. , Lynch , D. W. and Bevolo , A. J. 1989 . Surf. Science , 219 : L623
  • Hobbs , L. W. , Hughes , A. E. and Pooley , D. 1973 . Proc. Royal Soc. Lond. , A332 : 167
  • Mira Basic , Coherent Laser Group, Inc. .
  • Teegarden , K. and Baldini , G. 1967 . Phys. Rev. , 155 : 896
  • Haupt , U. 1959 . Z. Physik , 157 : 232
  • Nanoscope II AFM , Digital Instruments, Inc. .
  • Wurz , P. and Becker , C. H. 1989 . Surf. Science , 224 : 559
  • Seifert , N. , Ye , H. , Albridge , R. , Barnes , A. , Yan , Q. , Vijayalakshmi , S. , Tolk , N. , Husinsky , W. and Betz , G. 1994 . Radiation Effects and Defects in Solids , 128 : 15

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.