References
- Jangu, C.; Long, T. E. Polymer 2014, 55, 3298–3304.
- Pérez, M.; Qu, Z.-W.; Caputo, C. B.; Podgorny, V.; Hounjet, L. J.; Hansen, A.; Dobrovetsky, R.; Grimme, S.; Stephan, D. W. Chem. Eur. J. 2015, 21, 6491–6500.
- Aoyagi, N.; Furusho, Y.; Endo, T. Tetrahedron Lett. 2013, 54, 7031–7034.
- Brunet, J.-J.; Chu, N. C.; Diallo, O. Organometallics 2005, 24, 3104–3110.
- Pews-Davtyan, A.; Jackstell, R.; Spannenberg, A.; Beller, M. Chem. Commun. 2016, 52, 7568–7571.
- Roy, M.-N.; Poupon, J.-C.; Charette, A. B. J. Org. Chem. 2009, 74, 8510–8515.
- He, R.; Ding, C.; Maruoka, K. Angew. Chem. Int. Ed. 2009, 48, 4559–4561.
- Yeo, H. M.; Ryu, B. J.; Nam, K. C. Org. Lett. 2008, 10, 2931–2934.
- a) Uraguchi, D.; Ito, T.; Ooi, T. J. Am. Chem. Soc. 2009, 131, 3836–3837. b) Uraguchi, D.; Sakaki, S.; Ooi, T. J. Am. Chem. Soc. 2007, 129, 12392–12393.
- Takeda, T.; Terada, M. J. Am. Chem. Soc. 2013, 135, 15306–15309.
- Chatelet, B.; Joucla, L.; Dutasta, J.-P.; Martinez, A.; Dufaud, V. Chem. Eur. J. 2014, 20, 8571–8574.
- Hounjet, L. J.; Caputo, C. B.; Stephan, D. W. Angew. Chem. Int. Ed. 2012, 51, 4714–4717.
- Ekubo, A. T.; Elsegood, M. R. J.; Lake, A. J.; Smith, M. B. Inorg. Chem. 2009, 48, 2633–2638.
- Frank, A. W.; Drake, G. L. J. Org. Chem. 1972, 37, 2752–2755.
- Spiridonova, Y. S.; Balueva, A. S.; Krivolapov, D. B.; Litvinov, I. A.; Musina, E. I.; Karasik, A. A.; Sinyashin, O. G. Russ. Chem. Bull., Int. Ed. 2013, 62, 2487–2494.
- (a) Gupta, A. K.; Nagarkar, S. S.; Boomishankar, R. Dalton Trans. 2013, 42, 10964–10970 and references cited therein. (b) Gupta, A. K.; Nicholls, J.; Debnath, S.; Rosbottom, I.; Steiner, A.; Boomishankar, R. Cryst. Growth Des. 2011, 11, 555–564.
- Gholivand, K.; Mostaanzadeh, H.; Farshadian, S. Acta Cryst. E, Cryst. Commun. 2011, 67, o311.
- Allen, F. H. Acta Cryst. 2002, B58, 380–388.
- SMART, SAINT and APEX 2 Software for CCD diffractometers, Bruker AXS Inc.: Madison, WI, 2001 and 2010.
- Sheldrick, G. M. Acta Crystallogr. Sect. A 2008, 64, 112–122.
- Sheldrick, G. M. SHELXTL User Manual, Version 6.12. Bruker AXS Inc.: Madison, WI, USA, 2001.