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Integrated Ferroelectrics
An International Journal
Volume 36, 2001 - Issue 1-4
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Original Articles

MOCVD PBZRxti1−xo3 thin films on platinized silicon wafers and srtio3 crystals

Growth and optical properties

Mona P. Moret University of Nijmegen, Research Institute for Materials, Toernooiveld 1, 6525 ED, Nijmegen
,
Marijn A.C. Devillers University of Nijmegen, Research Institute for Materials, Toernooiveld 1, 6525 ED, Nijmegen
,
Andy R.A. Zauner University of Nijmegen, Research Institute for Materials, Toernooiveld 1, 6525 ED, Nijmegen
,
Edwin Aret University of Nijmegen, Research Institute for Materials, Toernooiveld 1, 6525 ED, Nijmegen
,
Paul R. Hageman University of Nijmegen, Research Institute for Materials, Toernooiveld 1, 6525 ED, Nijmegen
&
Poul K. Larsen University of Nijmegen, Research Institute for Materials, Toernooiveld 1, 6525 ED, Nijmegen
Pages 265-274 | Received 14 Mar 2001, Published online: 19 Aug 2006

References

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  • Moret , M. P. , Rössinger , S. A. , Hageman , P. R. , Devillers , M. A. , Van Der Linden , H. , Haverkamp , E. and Larsen , P. K. 2000 . Ferroelectrics , 241 : 149 – 158 .
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