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Integrated Ferroelectrics

An International Journal

Volume 38, 2001 - Issue 1-4

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Section F: Novel characterization

Piezoresponse scanning force microscopy: What quantitative information can we really get out of piezoresponse measurements on ferroelectric thin films

Catalin Harnagea Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120, Halle/Saale, Germany

Alain Pignolet Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120, Halle/Saale, Germany

Marin Alexe Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120, Halle/Saale, Germany

Dietrich Hesse Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, D-06120, Halle/Saale, Germany

Pages 23-29 | Received 14 Mar 2001, Published online: 19 Aug 2006

Cite this article
https://doi.org/10.1080/10584580108016914

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