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Integrated Ferroelectrics
An International Journal
Volume 61, 2004 - Issue 1
103
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Original Articles

Understanding Thickness Effects in Thin Film Capacitors

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Pages 51-58 | Received 01 Aug 2003, Accepted 01 Jan 2004, Published online: 11 Oct 2011

REFERENCES

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  • Sinnamon , L. J. , McAneney , J. , Bowman , R. M. and Gregg , J. M. 2003 . “Dependence of the interfacial capacitance on measurement regime used for investigation of thin film ferroelectric capacitors” . J. Appl. Phys. , 93 : 736 – 744 . http://dx.doi.org/10.1063/1.1522476
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  • Kut , John . June 2003 . June , Cambridge University . Part III Thesis
  • Dawber , Matthew . August 2003 . Cambridge University . Ph.D. thesis
  • Dawber , Matthew , Rabe , Karin and Scott , JamesF. 2004 . Rev. Mod. Phys. , in press

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