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Integrated Ferroelectrics
An International Journal
Volume 73, 2005 - Issue 1
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SECTION B: TESTING AND CHARACTERIZATION

NANOSCALE PIEZOELECTRIC AND ELASTIC PHENOMENA OF FERROELECTRIC DOMAIN

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Pages 141-148 | Received 17 Apr 2005, Published online: 11 Oct 2011

REFERENCES

  • Gruverman , A. , Auciello , O. and Tokumoto , H. 1998 . Imaging and control of domain structure in ferroelectrics thin films via scanning force microscopy . Ann. Rev. Mater Sci. , 28 : 101 – 123 . [CSA]
  • Nagarajan , V. , Roytburd , A. , Stanishievskv , A. , Prasertchoung , S. , Zhao , T. , Chen , L. , Melngailis , J. , Auciello , O. and Ramesh . 2003 . Dynamics of ferroelastic domains in ferroelectric thin films . Nature Material , 2 : 43 – 47 . [CROSSREF] [CSA]
  • Kalinin , S. V. and Bonnell , D. 2002 . Imaging mechanism of piezoresponse force microscopy o ferroelectric surfaces . Phys. Rev. B , 65 : 125408/1 – 125408/11 . [CROSSREF] [CSA]
  • Rabe , U. , Amelio , S. , Kester , E. , Scherer , V. , Hirsekorn , S. and Arnold , W. 2000 . Quantitative determination of contact stiffness using atomic force acoustic microscopy . Ultrasonics , 38 : 430 – 437 . [CROSSREF] [CSA]
  • Rabe , U. , Kopycinska , M. , Hirsekorn , S. , Muñoz Saldaña , J. , Schneider , G. A. and Arnold , W. 2002 . High-resolution characterization of piezoelectric ceramics by ultrasonic scanning force microscopy techniques . J Phys D: Appl Phys , 35 : 2621 – 2635 . [CROSSREF] [CSA]
  • Yamanaka , K. and Nakano , S. 1996 . Ultrasonic atomic force microscope with overtone excitation of cantilever . Jpn. J. Appl. Phys. , 35 : 3787 – 3792 . [CROSSREF] [CSA]
  • Tsuji , T. , Ogiso , H. , Akedo , J. , Saito , S. , Fukuda , K. and Yamanaka , K. 2004 . Evaluation of domain boundary of piezo/ferroelectric material by ultrasonic atomic force microscopy . Jpn. J. Appl. Phys. , 43 : 2907 – 2913 . [CROSSREF] [CSA]
  • Yamanaka , K. , Ogiso , H. and Kolosov , O. 1994 . Ultrasonic force microscopy for nanometer resolution subsurface imaging . Appl Phys Lett , 64 : 178 – 180 . [CROSSREF] [CSA]
  • Kolosov , O. V. , Castell , M. R. , Marsh , C. D. , Briggs , G. A. D. , Kamins , T. I. and Williams , R. S. 1998 . Imaging the elastic nanostructure of Ge islands by ultrasonic force microscopy . Phys. Rev. Lett. , 81 : 1046 – 1049 . [CROSSREF] [CSA]
  • Inagaki , K. , Kolosov , O. V. , Briggs , G. A. D. and Wright , O. B. 2000 . Waveguide ultrasonic force microscopy at 60 MHz . Appl. Phys. Lett. , 76 : 1836 – 1838 . [CROSSREF] [CSA]
  • Matsuda , O. , Terada , T. , Inagaki , K. and Wright , O. B. 2002 . Cantilever dynamics in ultrasonic force microscopy . Jpn. J. Appl. Phys. , 41 : 3545 – 3546 . [CROSSREF] [CSA]
  • Moulson , A. and Herbert , J. M. 1990 . Electroceramics , London : Chapman and Hall Press .
  • Zhang , L. N. , Chu , R. Q. , Zhao , S. C. , Li , G. R. and Yin , Q. R. 2005 . Microstructure and electrical properties of niobium doped Bi4Ti3O12 layer-structured piezoelectric ceramics . Mater Sci & Eng B. , 116 : 99 – 103 . [CROSSREF] [CSA]
  • Luo , H. S. , Xu , G. S. , Xu , H. Q. , Wang , P. C. and Yin , Z. W. 2000 . Compositional Homogeneity and Electrical Properties of Lead Magnesium Niobate Titanate Single Crystals Grown by a Modified Bridgman Technique . Jpn. J Appl Phys , 39 : 5581 – 5585 . [CROSSREF] [CSA]
  • Johnson , K. L. 1985 . Contact Mechanics , Cambridge : Cambridge University Press .

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