Publication Cover
Integrated Ferroelectrics
An International Journal
Volume 122, 2010 - Issue 1
118
Views
3
CrossRef citations to date
0
Altmetric
Original Articles

Fabrication and Characterization of Bismuth Lanthanum Titanate (Bi3.25La0.75Ti3O12) Thin Films for FeRAM Devices

, , &
Pages 63-73 | Received 13 Dec 2009, Accepted 03 Apr 2010, Published online: 20 Nov 2010

References

  • Scott , J. F. and Paz de Araujo , C. A. 1989 . Ferroelectric memories . Science , 246 : 1400
  • Subbarao , E. C. 1961 . Ferroelectricity in Bi4Ti3O12 and Its Solid Solutions . Phys. Rev , 122 : 804 – 807 .
  • Park , B. H. 1999 . Lanthanum-substituted bismuth titanate for use in non-volatile memories . Nature , 401 : 682
  • Simoes , A. Z. , Ramirez , M. A. , Longo , E. and Varela , J. A. 2008 . Leakage current behavior of Bi3.25La0.75Ti3O12 ferroelectric thin films deposited on different bottom electrodes . Mater. Chem. Phys. , 107 : 72
  • Kim , J. H. , Kim , J. K. , Heo , S. Y. and Lee , H. S. 2006 . Ferroelectric properties of sol-gel prepared La- and Nd-substituted, and Nb-co-substituted bismuth titanate using polymeric additives . Thin Solid Films , 503 : 60
  • Scott , J. F. 2007 . Applications of Modern Ferroelectrics . Science , 315 : 954
  • Hu , H. and Krupanidhi , S. B. 1994 . Current-voltage characteristics of ultrafine-grained ferroelectric Pb(Zr, Ti)O3 thin films . J. Mater. Res. , 9 : 1484
  • Stolichnov , I. and Tagantsev , A. 1998 . Space-charge influenced-injection model for conduction in Pb(Zr x Ti1−x )O3 thin films . J. Appl. Phys. , 84 : 3216
  • Scott , J. F. , Melnick , B. M. , Cuchiaro , J. D. , Zuleeg , R. , Araujo , C. A. , McMillan , L. D. and Scott , M. C. 1994 . Negative differential resistivity in ferroelectric thin-film current-voltage relationships . Integr. Ferroelectr. , 4 : 85
  • Chen , X. , Kingon , A. , Al-Shareef , H. and Bellur , K. R. 1994 . Electrical transport and dielectric breakdown in Pb(Zr,Ti)O3 thin films . Ferroelectrics , 151 : 133
  • Mihara and Watanabe , H. 1995 . Electronic Conduction Characteristics of Sol-Gel Ferroelectric Pb(Zr 0.4 Ti 0.6)O 3 Thin-Film Capacitors . Part I Jpn.J. Appl. Phys. , 34 : 5664
  • Chen , H. D. , Udaykumar , K. R. , Li , K. , Gaskey , Ch. and Cross , L. E. 1997 . Dielectric breakdown strength in sol-gel derived PZT thick films . Integr. Ferroelectr. , 15 : 89
  • Laha , A. and Krupanidhi , S. B. 2002 . Leakage current conduction of pulsed excimer laser ablated BaBi2Nb2O9 thin films . J. Appl. Phys. , 92 : 415
  • Bhattacharya , S. , Laha , A. and Krupanidhi , S. B. 2002 . Analysis of leakage current conduction phenomenon in SrBi2Ta2O9 thin films grown by excimer laser ablation . J. Appl. Phys. , 91 : 4543
  • Simões , A. Z. , Ramírez , M. A. , Riccardi , C. S. , Longo , E. and Varela , J. A. 2005 . Ferroelectric properties and leakage current characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method . J. Appl. Phys. , 98 : 114103
  • Kao , M. C. , Chen , H. Z. and Young , S. L. 2008 . Ferroelectric properties and leakage current mechanisms of Bi3.25La0.75Ti3O12 thin films with a-axis preferred orientation prepared by sol–gel method. . Mater. Lett. , 62 : 629
  • Kim , N. K. , Song , C. R. , Kweon , S. Y. , Choi , S. E. , Lee , S. E. , Yeom , S. J. and Row , J. S. 2002 . Ferroelectric Properties and Current Conduction mechanisms of Pt/(Bi,La) 4 Ti 3 O 12 /Pt Capacitors . Integr. Ferroelectr. , 47 : 102
  • Mott , N. F. and Gurney , R. W. 1940 . Electronic processes in Ionic Crystals , Oxford press .
  • Kao , K. C. and Hwang , W. 1981 . Electrical Transport in Solids , Oxford : Pergamon .
  • Lampert , M. A. and Mark , P. 1970 . Current Injection in Solids , New York : Academic .
  • Helfrich , W. and Mark , P. 1962 . Z. Phys. , 166 : 370
  • Helfrich , W. and Mark , P. 1962 . Z. Phys. , 168 : 495
  • Kumar , P. , Misra , A. , Kamalasanan , M. N. , Jain , S. C. and Kumar , V. 2007 . Charge transport through conducting organic poly(2-methoxy-5- (2-ethylhexyloxy)-1,4-phenylenevinylene . J. Phys. D: Appl. Phys. , 40 : 561
  • Kumar , P. , Kumar , H. , Chand , S. , Jain , S. C. , Kumar , V. , Pant , R. P. and Tandon , R. P. 2008 . Effect of CoFe magnetic nanoparticles on the hole transport in poly(2-methoxy, 5-(2-ethylhexiloxy) 1,4-phenylenevinylene) . J. Phys. D: Appl. Phys. , 41 : 185104
  • Gloud , R. D. and Rahman , M. S. 198 . Power-law currents in some ZnO-Sn composite materials . J. Phys. D: Appl. Phys. , 114 : 79
  • Liang , T. , Guo , X. , Guan , B. , Guo , J. , Gu , X. , Lin , Q. , Wu , D. , Gao , G. , Zhu , Y. and Shen , G. 2007 . Current-voltage characteristics of p-GaAs/n-GaN heterojunction fabricated by wafer bonding . Appl. Phys. Lett. , 90 : 102107
  • Shulman , H. S. , Testorf , M. , Damjanovic , D. and Setter , N. 1996 . microstructure, electrical conductivity and piezoelectric properties of Bismuth Titanate. . J. Ame. Ceram. Soc. , 79 : 3124
  • Sakashita , Y. , Segawa , H. , Tominaga , K. and Okada , M. 1993 . Dependence of electrical properties on film thickness in Pb(Zr x Ti1−x )O3 thin films produced by metalorganic chemical vapor deposition . J. Appl. Phys. , 73 : 7857
  • Lee , J. J. , Thio , C. L. and Desu , S. B. 1995 . Electrode contacts on ferroelectric Pb(Zr,Ti)O3 and SrBi2Ta209 thin films and their influence on fatigue properties . J. Appl. Phys. , 78 : 5073
  • Larsen , P. K. , Dormans , G. J. M. , Taylor , D. J. and van Veldhoven , P. J. 1994 . Ferroelectric properties and fatigue of PbZr0.51Ti0.49O3 thin films of varying thickness: Blocking layer model . J. Appl. Phys. , 76 : 2405
  • Kim , K. T. , Song , S. H. and Kim , C. I. 2004 . J. Vac. Sci. Technol. A , 22 : 4
  • Lee , H. N. and Hesse , D. 2001 . Appl. Anisotropic ferroelectric properties of epitaxially twinned Bi3.25La0.75Ti3O12 thin films grown with three different orientations . Phys. Lett. , 80 : 1040
  • Sze , S. M. 1981 . Physics of Semiconductor Devices , New York : Wiley .
  • Jain , S. C. , Wilander , M. and Kumar , V. 2007 . Conducting Organic Materials and Devices , San Diego : Academic Press .

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.