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Integrated Ferroelectrics
An International Journal
Volume 237, 2023 - Issue 1
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Research Article

Extension of Surface Charge Density Studies of Metal Oxide Semiconductor (MOS) Structure to Polarization Studies of Metal Ferroelectric Metal (MFM) Structure in Bulk Form: Experimental and Simulation of Polarization Data

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Pages 251-257 | Received 19 Apr 2023, Accepted 14 Jul 2023, Published online: 10 Sep 2023

References

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