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Integrated Ferroelectrics
An International Journal
Volume 16, 1997 - Issue 1-4
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Memory devices and charecterization

Dielectric properties of unannealed ECR-sputtered (Ba, Sr) TiO3 films under DC-bias stresses

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Pages 209-217 | Received 18 Mar 1996, Published online: 19 Aug 2006

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