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Integrated Ferroelectrics
An International Journal
Volume 22, 1998 - Issue 1-4
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Session 7. Testing and characterization

Addition of Ca and Sr in PLZT to improve fram® performance and reliability

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Pages 183-193 | Received 03 Apr 1998, Published online: 19 Aug 2006

References

  • Hadnagy , T. D. and Sheldon , D. J. 1994 . Retention and Endurance Effects of 4K and 64K FRAM® Memories Integrated Ferrolectrics , 4 : 217 – 226 .
  • Traynor , S. D. , Hadnagy , T. D. and Kammerdiner , L. 1997 . Integrated Ferroelectrics . Capacitor Test Simulation of Retention and Imprint Characteristics for Ferroelectric Memory Operation , 16 : 63 – 76 .
  • Jaffe , B. , Cook , W. R. Jr. and Jaffe , H. Piezoelectric Ceramics Chapter , 44108 Ohio , , U.S.A. : 7 Gould Inc. Cleveland .
  • Hadnagy , T. D. 1997 . Integrated Ferroelectrics . Materials and Production Characterization Requirements for the Production of FRAM® Memory Products , 18 : 1 – 17 .
  • Larsen , P. K. , GJM Domans , Taylor , D. J. and Van Veldhoven , P. J. 1994 . Ferroelectric Properties and Fatigue of PbZr0.51 Ti49O3 Thin Films of Varying Thickness Blocking Layer Model J. Applied Physics , 76 ( No. 1 )
  • Data from Fujitsu, Private Communications with Koichi Oki .

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