References
- Hadnagy , T. D. and Sheldon , D. J. 1994 . Retention and Endurance Effects of 4K and 64K FRAM® Memories Integrated Ferrolectrics , 4 : 217 – 226 .
- Traynor , S. D. , Hadnagy , T. D. and Kammerdiner , L. 1997 . Integrated Ferroelectrics . Capacitor Test Simulation of Retention and Imprint Characteristics for Ferroelectric Memory Operation , 16 : 63 – 76 .
- Jaffe , B. , Cook , W. R. Jr. and Jaffe , H. Piezoelectric Ceramics Chapter , 44108 Ohio , , U.S.A. : 7 Gould Inc. Cleveland .
- Hadnagy , T. D. 1997 . Integrated Ferroelectrics . Materials and Production Characterization Requirements for the Production of FRAM® Memory Products , 18 : 1 – 17 .
- Larsen , P. K. , GJM Domans , Taylor , D. J. and Van Veldhoven , P. J. 1994 . Ferroelectric Properties and Fatigue of PbZr0.51 Ti49O3 Thin Films of Varying Thickness Blocking Layer Model J. Applied Physics , 76 ( No. 1 )
- Data from Fujitsu, Private Communications with Koichi Oki .