Publication Cover
Integrated Ferroelectrics
An International Journal
Volume 26, 1999 - Issue 1-4
21
Views
2
CrossRef citations to date
0
Altmetric
Section I: Materials processing – chemical solution deposition

Comparison of CSD and sputtered PZT with iridium electrodes

, , &
Pages 215-223 | Received 07 Mar 1999, Published online: 19 Aug 2006

References

  • Aoki , K. , Fukuda , Y. , Numata , K. and Nishimura , A. 1996 . Jpn. J. Appl. Phys. , 35 : 2210 Part 1
  • Nakamura , T. , Nakao , Y. , Kamisawa , A. and Takasu , H. 1994 . Appl. Phys. Lett. , 65 : 1522
  • Kushida-Abdelghafar , K. , Miki , H. , Yano , F. and Fujisaki , Y. 1997 . Jpn. J. Appl Phys. , 36 : L-1032 Part 2
  • Kushida-Abdelghafar , K. , Hiratani , M. and Fujisaki , Y. 1999 . J. Appl. Phys. , 85 : 1069
  • Kushida-Abdelghafar , K. and Fujisaki , Y. 1998 . Jpn. J. Appl. Phys. , 37 : L808 Part 2
  • Hadnagy , T. D. and Davenport , T. 1998 . Integrated Ferroelectrics , 22 : 183
  • Traynor , S. D. , Hadnagy , T. D. and Kammerdiner , L. 1997 . Integrated Ferroelectrics , 16 : 63
  • Hadnagy , T. D. 1997 . Integrated Ferroelectrics , 18 : 1
  • Traynor , S. , Sun , S. and Hadnagy , T. D. Remanence Polarity Effects on Hydrogen Damage of Ferroelectric Thin Film Capacitors . Integrated Ferroelectrics , this proceedings

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.