Advanced search
Publication Cover
LEUKOS
The Journal of the Illuminating Engineering Society
Volume 10, 2014 - Issue 1
Submit an article Journal homepage
543
Views
7
CrossRef citations to date
0
Altmetric
Articles

Relationship between Peak Wavelength and Dominant Wavelength of Light Sources Based on Vector-Based Dominant Wavelength Calculation Method

Qi YaoCollege of Architecture and Urban Planning, Shenzhen University, Shenzhen, China
,
Jiaqi JuInstitute for Electric Light Sources, Fudan University, Shanghai, China
,
Rongqing LiangInstitute for Electric Light Sources, Fudan University, Shanghai, China
,
Dahua ChenInstitute for Electric Light Sources, Fudan University, Shanghai, China
&
Haitian ZhaoCollege of Architecture and Urban Planning, Shenzhen University, Shenzhen, ChinaCorrespondence[email protected]
Pages 11-18 | Received 21 Jan 2013, Accepted 16 Jul 2013, Published online: 18 Oct 2013

REFERENCES

  • [CIE] Commission Internationale de l’Eclairage. 2004. Colorimetry. Vienna (Austria): CIE. Publication No. 15:2004. 21 p.
  • Daun JK. 1978. Mathematical method for estimating color of spaghetti and mustard flour. Cereal Chem. 55(5):692-698.
  • Heredia FJ, Chozas MG. 1992. Proposal of a novel formula to calculate dominant wavelength for colour of red wines. Food Chem. 43(2): 125-128.
  • Kelly KL. 1943. Color designation for lights. J Opt Soc Am. 33(11): 627-632.
  • Man K, Ashdown I. 2006. Accurate colorimetric feedback for RGB LED clusters. P Soc Photo-Opt Ins. 6337:1-8.
  • McCarley JE, Green CE, Horowitz KH. 1965. Digital system for converting spectrophotometric data to CIE coordinates, dominant wavelength, and excitation purity. J Opt Soc Am. 55(4):355-360.
  • Ohno Y. 2004. Color rendering and luminous efficacy of white LED spectra. 4th International conference on solid state lighting. P Soc Photo-Opt Ins. 5530:88-98.
  • Schanda J. 2007. Colorimetry: understanding the CIE system. Hoboken (NJ): Wiley. 459 p.
  • Warschewski D, Brungs MP. 1980. A compact computer programme for the specification of dominant wavelength and purity. Color Res Appl. 5(3):173-174.
  • Zhou SJ, Liu S. 2009. Transient measurement of light-emitting diode characteristic parameters for production lines. Rev Sci Instrum. 80:1-7.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Order Reprints Request Corporate Permissions

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

Request Academic Permissions

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.

Related research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.