REFERENCES
- Constal, E.C.; Holmes, J.M. Inorg. Chim. Acta 1987, 126, 187–193.
- Bino, A.; Frim, R.; Genderen, M.V. Inorg. Chim. Acta 1987, 127, 95–101.
- Wester, D.; Palenik, G.J. J. Am. Chem. Soc. 1973, 95, 6505–6506.
- Sreeja, P.B.; Sreekanth, A.; Nayar, C.R.; Kurup, M.R. P.; Usman, A.; Razak, I.A.; Chantrapromma, S.; Fun, H.K. J. Mol. Struct. 2003, 645, 221–226.
- Nie, L.; Hu, L.; Fu, X.C. Chem. J. Chin. Univ. 2011, 32, 56–61.
- Paschalidis, D.G.; Tossidis, I.A.; Gdaniec, M. Polyhedron 2000, 19, 2629–2637.
- Shi, T.; He, S.Y.; Wang, X.F.; Wang, Y.B.; Tang, Z.X.; Wen, Z.Y. J. Mol. Struct.: Theochem. 2005, 732, 201–209.
- He, S.Y.; Liu, Y.; Zhao, J.S.; Zhao, H.A.; Yang, R.; Hong, R.Z.; Shi, Q.Z. Chin. J. Chem. 2003, 21, 139–145.
- Sheldrick, G.M. SHELXTL-97; A Program for Refining Crystal Structures, Version 5.10; Bruker AXS Inc., Madison, WI, 1997.
- Madison, W.I. SMART and SAINT; Siemens Analytical X-Ray Instruments, Inc., 1996.
- He, S.Y.; Yang, R.; Wu, W.T.; Shi, Q.Z.; Wang, D.Q.; An, D.R. Chin. J. Chem. 2005, 23, 1198–1202.