References
- H. Hasebe and S. Kobayashi, presented at the SID International Symposium, Sheraton-Twin Towers, Orlando, FL, 1985.
- F. Yamada, H. Nakamura, Y. Sakaguchi, and Y. Taira, J. Soc. Inf. Disp. 10 (1), 81–85 (2002). doi: 10.1889/1.1827848
- J.H. Kwon, J. Inf. Disp. 10 (2), 45–48 (2010). doi: 10.1080/15980316.2010.9652118
- B.W. Lee, C. Park, S. Kim, T. Kim, Y. Yang, J. Oh, J. Choi, M. Hong, D. Sakong, K. Chung, S. Lee, and C. Kim, presented at the SID International Symposium, Baltimore Convention Center, Baltimore, MD, 2003.
- B.W. Lee, K. Song, Y. Yang, C. Park, J. Oh, C. Chai, J. Choi, N. Roh, M. Hong, K. Chung, S. Lee, and C. Kim, presented at the SID International Symposium, Washington State Convention Center, Seattle, WA, 2004.
- C.H.B. Elliott, T.L. Credelle, and M.F. Higgins, Inf. Disp. 21 (5), 26–30 (2005).
- C.C. Lai and C.C. Tsai, IEEE Trans. Consum. Electron. 53 (4), 1628–1633 (2007). doi: 10.1109/TCE.2007.4429262
- S. Wen, J. Inf. Disp. 10 (4), 164–170 (2009). doi: 10.1080/15980316.2009.9652101
- M. Hammer and K.J.G. Hinnen, IEEE J. Disp. Technol. 10 (1), 33–42 (2014). doi: 10.1109/JDT.2013.2278985
- S.S. Kim, presented at the SID International Symposium, Hynes Convention Center Station, Boston, MA, 2005.
- N. Koma and T. Uchida, J. Soc. Inf. Disp. 11 (2), 413–417 (2003). doi: 10.1889/1.1825656
- B. Lee, C. Park, S. Kim, M. Jeon, J. Heo, D. Sagong, J. Kim, and J. Souk, presented at the SID International Symposium, San Jose Convention Center, San Jose, CA, 2001.
- S.J. Kim, K.C. Shin, H. Kim, H.G. Oh, J.H. Jung, and H.S. Kim, J. Inf. Disp. 14 (3), 93–96 (2013). doi: 10.1080/15980316.2013.837843
- W. Huanga, J.M. Lia, L.M. Yanga, Z.L. Jina, Z.G. Zhonga, Y. Liua, Q.Y. Choua, and F. Li, Opt. Laser Technol. 11 (1), 214–217 (2011). doi: 10.1016/j.optlastec.2010.06.016