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Articles

A phosphine oxide-substituted double spirobifluorene compound with high thermal stability

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Pages 105-109 | Received 30 Oct 2014, Accepted 13 Apr 2015, Published online: 23 Jun 2015

References

  • C. Adachi, M.A. Baldo, M.E. Thompson and S.R. Forrest, J. Appl. Phys. 90, 5048 (2001). doi: 10.1063/1.1409582
  • L. Xiao, S.-J. Su, Y. Agata, H. Lan and J. Kido, Adv. Mater. 21, 1271 (2009). doi: 10.1002/adma.200802034
  • J.Y. Lee, J. Inf. Disp. 15, 139 (2014). doi: 10.1080/15980316.2014.937364
  • S.O. Jeon, S.E. Jang, H.S. Son and J.Y. Lee, Adv. Mater. 23, 1436 (2011). doi: 10.1002/adma.201004372
  • S.E. Jang, C.W. Joo, S.O. Jeon, K.S. Yook and J.Y. Lee, Org. Electron. 11, 1059 (2010). doi: 10.1016/j.orgel.2010.03.005
  • S.E. Jang, K.S. Yook and J.Y. Lee, Org. Electron, 11, 1154 (2010). doi: 10.1016/j.orgel.2010.04.004
  • T. Spehr, R. Rudzich, T. Fuhrmann and J. Salbeck, Org. Electron. 4, 61 (2003). doi: 10.1016/j.orgel.2003.08.002
  • C. Hosokawa, H. Higashi, H. Nakamura and T. Kusumoto, Appl. Phys. Lett. 67, 2455 (1995). doi: 10.1063/1.115295
  • Z. Jiang, H. Yao, Z. Zhang, C. Yang, Z. Liu, Y. Tao, J. Qin and D. Ma, Org. Lett. 11, 2607 (2009). doi: 10.1021/ol9008816
  • T.P.I. Saragi, T. Spehr, A. Siebert, T. Fuhrmann-Lieker and J. Salbeck, Chem. Rev. 107, 1011 (2007). doi: 10.1021/cr0501341
  • X. Cheng, G.H. Hou, J.H. Xie and Q.L. Zhou, Org. Lett. 14, 2381 (2004). doi: 10.1021/ol0492546
  • J.Y. Shen, C.Y. Lee, T.H. Huang, J.T. Lin, Y.T. Tao, C.H. Chien and C. Tsai, J. Mater. Chem. 15, 2455 (2005). doi: 10.1039/b501819f
  • J. Salbeck, F. Weissoertel and J. Bauer, Macromol. Symp. 125, 121 (1997). doi: 10.1002/masy.19981250110
  • R. Pudzich, T. Fuhrmann-Lieker and J. Salbeck, Adv. Polym. Sci, 199, 83 (2006).
  • T. Kowada, T. Kuwabara and K. Ohe, J. Org. Chem. 75, 906 (2010). doi: 10.1021/jo902482n
  • D. Thirion, C. Poriel, F. Barrire, R. Mtivier, O. Jeannin and J. Rault-Berthelot, Org. Lett. 11, 4974 (2009). doi: 10.1021/ol901750x
  • C. Poriel, J.-J. Liang, J. Rault-Berthelot, F. Barrière, N. Cocherel, A.M.Z. Slawin, D. Horhant, M. Virboul, G. Alcaraz, N. Audebrand, L. Vignau, N. Huby, G. Wantz and L. Hirsch, Chem. Eur. J. 13, 10055 (2007). doi: 10.1002/chem.200701036
  • D. Horhant, J.J. Liang, M. Virboul, C. Poriel, G. Alcaraz and J. Rault-Berthelot, J. Org. Lett. 8, 257 (2006). doi: 10.1021/ol0526064
  • Y.J. Cho, O.Y. Kim and J.Y. Lee, Org. Electron. 13, 351 (2012). doi: 10.1016/j.orgel.2011.11.028
  • Y.J. Cho and J.Y. Lee, Org. Electron. 13, 1044 (2012). doi: 10.1016/j.orgel.2012.03.006
  • Y.J. Cho and J.Y. Lee, Thin Solid Films. 522, 415 (2012). doi: 10.1016/j.tsf.2012.08.034
  • M.J. Frisch, G.W. Trucks, H.B. Schlegel, G.E. Scuseria, M.A. Robb, J.R. Cheeseman, J.A. Montgomery, T. VrevenJr., K.N. Kudin, J.C. Burant, J.M. Millam, S.S. Iyengar, J. Tomasi, V. Barone, B. Mennucci, M. Cossi, G. Scalmani, N. Rega, G.A. Petersson, H. Nakatsuji, M. Hada, M. Ehara, K. Toyota, R. Fukuda, J. Hasegawa, M. Ishida, T. Nakajima, Y. Honda, O. Kitao, H. Nakai, M. Klene, X. Li, J.E. Knox, H.P. Hratchian, J.B. Cross, C. Adamo, J. Jaramillo, R. Gomperts, R.E. Stratmann, O. Yazyev, A.J. Austin, R. Cammi, C. Pomelli, J.W. Ochterski, P.Y. Ayala, K. Morokuma, G.A. Voth, P. Salvador, J.J. Dannenberg, V.G. Zakrzewski, S. Dapprich, A.D. Daniels, M.C. Strain, O. Farkas, D.K. Malick, A.D. Rabuck, K. Raghavachari, J.B. Foresman, J.V. Ortiz, Q. Cui, A.G. Baboul, S. Clifford, J. Cioslowski, B.B. Stefanov, G. Liu, A. Liashenko, P. Piskorz, I. Komaromi, R.L. Martin, D.J. Fox, T. Keith, M.A. Al-Laham, C.Y. Peng, A. Nanayakkara, M. Challacombe, P.M.W. Gill, B. Johnson, W. Chen, M.W. Wong, C. Gonzalez and J.A. Pople, Gaussian03, Revision B05 (Gaussian, Inc., Pittsburgh, PA, 2003).
  • M. Sauer, J. Hofkens and J. Enderlein, Basic Principles of Fluorescence Spectroscopy, in Handbook of Fluorescence Spectroscopy and Imaging: From Single Molecules to Ensembles, edited by M. Sauer, J. Hofkens and J. Enderlein (Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany, 2011), pp. 15–17.

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