References
- G. Gu, V. Bulović, P.E. Burrows, S.R. Forrest and M.E. Thompson, Appl. Phys. Lett. 68, 2606 (1996). doi: 10.1063/1.116196
- C.W. Tang and S.A. VanSlyke, Appl. Phys. Lett. 51, 913 (1987). doi: 10.1063/1.98799
- J.W. Doane, N.A. Vaz, B.-G. Wu and S. Žumer, Appl. Phys. Lett. 48, 269 (1986). doi: 10.1063/1.96577
- J.W. Lee, J.K. Kim, F. Ahmad, M. Jamil and Y.J. Jeon, Liq. Cryst. 41, 1109 (2014). doi: 10.1080/02678292.2014.904013
- Y. Geng, P. Brogueira, J.L. Figueirinhas, M.H. Godinho and P.L. Almeida, Liq. Cryst. 40, 769 (2013). doi: 10.1080/02678292.2013.783137
- R.A.M. Hikmet, J. Appl. Phys. 68, 4406 (1990). doi: 10.1063/1.346190
- D.-K. Yang, J.L. West, L.-C. Chien and J.W. Doane, J. Appl. Phys. 76, 1331 (1994). doi: 10.1063/1.358518
- R. Vergaz, J.-M. Sánchez-Pena, D. Barrios, C. Vázquez and P. Contreras-Lallana, Sol. Energ. Mat. Sol. C. 92, 1483 (2008). doi: 10.1016/j.solmat.2008.06.018
- D. Barrios, R. Vergaz, J.M. Sanchez-Pena, C.G. Granqvist and G.A. Niklasson, Sol. Energ. Mat. Sol. C. 111, 115 (2013). doi: 10.1016/j.solmat.2012.12.012
- A. Azens and C. Granqvist, J. Solid State Electr. 7, 64 (2003). doi: 10.1007/s10008-002-0313-4
- B.-H. Yu, J.-W. Huh, K.-H. Kim and T.-H. Yoon, Opt. Express 21, 29332 (2013). doi: 10.1364/OE.21.029332
- J.-W. Huh, B.-H. Yu, J. Heo and T.-H. Yoon, Appl. Opt. 54, 3792 (2015). doi: 10.1364/AO.54.003792
- J. Heo, J.-W. Huh and T.-H. Yoon, AIP Advances 5, 047118 (2015). doi: 10.1063/1.4918277
- J.-W. Huh, S.-M. Ji, J. Heo, B.-H. Yu and T.-H. Yoon, J. Disp. Technol. 12, 779 (2016). doi: 10.1109/JDT.2016.2537827
- B.-H. Yu, J.-W. Huh, J. Heo and T.-H. Yoon, Liq. Cryst. 42, 1460 (2015). doi: 10.1080/02678292.2015.1061149