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Original Articles

Reliability: The Other Dimension of Quality

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Pages 1-25 | Received 01 Mar 2003, Accepted 01 Aug 2003, Published online: 09 Feb 2016

References

  • ATT (1990). Reliability by Design. ATT, Indianapolis, IN.
  • Abernethy, R. B., Breneman, J. E., Medlin, C. H. and Reinman, G. L. (1983). Weibull Analysis Handbook. Air Force Wright Aeronautical Laboratories Technical Report AFWAL-TR-83-2079. Available from the National Technical Information Service, Washington, DC.
  • Blischke, W. R. and Murthy, D. N. P. (1994). Warranty Cost Analysis. Marcel Dekker, New York.
  • Blischke, W. R. and Murthy, D. N. P. (eds.) (1996). Product Warranty Handbook. Marcel Dekker, New York.
  • Byrne, D. and Quinlan, J. (1993). Robust function for attaining high reliability at low cost. 1993 Proceedings Annual Reliability and Maintainability Symposium, 183–191, IEEE.
  • Condra, L. W. (1993). Reliability Improvement with Design of Experiments, 2nd edition. Marcel Dekker, New York.
  • Davis, T. P. (1998). The fallacy of reliability prediction in automotive engineering. Automotive Excellence, Spring 1998, 19–21. Published by The American Society for Quality (also available from http://www.timdavis.co.uk/predict.PDF).
  • Escobar, L. A., Meeker, W. Q., Kugler, D. L. and Kramer, L. L. (2002). Accelerated Destructive Degradation Tests: Data, Models, and Analysis. Preprint 2003–01, Department of Statistics, Iowa State University, Ames, Iowa.
  • Grove, D. M. and Davis, T. P. (1992). Engineering, Quality and Experimental Design. Longman.
  • Hooper, J. H. and Amster, S. J. (1990). Analysis and presentation of reliability data. In Handbook of Statistical Methods for Engineers and Scientists (Edited by Harrison M. Wadsworth). McGraw Hill, New York.
  • Hoyland, A. and Rausand, M. (1994). System Reliability Theory: Models and Statistics Methods. Wiley, New York.
  • Kackar, R. N. (1985). Off-line quality control, parameter design, and the Taguchi method (with discussion). Journal of Quality Technology, 17, 176–209.
  • Lawless, J. F. (1998). Statistical analysis of product warranty data. International Statistical Review, 66, 41–60.
  • Lawless, J. F. and Kalbfleisch, J. D. (1992). Some issues in the collection and analysis of field reliability data. In Survival Analysis: State of the Art (Edited by J. P. Klein and P. K. Goel), 141–152. Kluwer Academic Publishers.
  • Logothetis, N. and Wynn, H. P. (1994). Quality Through Design. Clarendon Press, Oxford.
  • McLean, H. (2000). HALT, HASS and HASA Explained: Accelerated Reliability Techniques. American Society for Quality Press.
  • Meeker, W. Q. and Escobar, L. A. (1998). Statistical Methods for Reliability Data. Wiley, New York.
  • Meeker, W. Q. and Escobar, L. A. (2001). Software for reliability data analysis and test planning. Brazilian Journal of Probability and Statistics, 15, 169–200.
  • Meeker, W. Q. and Escobar, L. A. (2003). SPLIDA (S-PLUS Life Data Analysis). www.public.iastate.edu/~splida.
  • Meeker, W. Q., Escobar, L. A. and Lu, C. J. (1998). Accelerated degradation tests: modeling and analysis. Technometrics, 40, 89–99.
  • Meeker, W. Q. and LuValle, M. J. (1995). An accelerated life test model based on reliability kinetics. Technometrics, 37, 133–146.
  • MIL-HDBK-189 (1981). Reliability Growth Management. Available from Naval Publications and Forms Center, 5801 Tabor Ave, Philadelphia, PA 19120.
  • Nelson, W. B. (2003a). Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications. ASA-SIAM Series on Statistics and Applied Probability, ASA-SIAM.
  • Nelson, W. B. (2003b). Bibliography on Accelerated Test Plans. Available from the author, [email protected], 739 Huntingdon Dr., Schenectady, NY 12309–2917.
  • Phadke, M. S. (1989). (Quality Engineering Using Robust Design. Prentice Hall, Englewood Cliffs.
  • Robinson, J. A. and McDonald, G. C. (1991). Issues related to field reliability and warranty data. In Data Quality Control: Theory and Pragmatics (Edited by Gunar E. Liepins and V. R. R. Uppuluri), 69–89. Marcel Dekker, New York.
  • Wu, C. F. J. and Hamada, M. (2000). Experiments: Planning, Analysis, and Parameter Design Optimization. Wiley, New York.
  • Wu, H. and Meeker, W. Q. (2002). Early detection of reliability problems using information from warranty data bases. Technometrics, 44, 120–133.

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