References
- Bhattacharyya, G. K., & Fries, A. (1982). Inverse Gaussian regression and accelerated life tests. Lecture Notes-Monograph Series, 2, 101–117.
- Boulanger, M., & Escobar, L. A. (1994). Experimental design for a class of accelerated degradation tests. Technometrics, 36, 260–272.
- Chhikara, R. S., & Folks, J. L. (1989). The Inverse Gaussian Distribution. New York: Marcel Dekker.
- Chiang, J. Y., Lio, Y. L., & Tsai, T. R. (2015). Degradation tests using geometric Brownian motion process for lumen degradation data. Quality and Reliability Engineering International, 31, 1797–1806.
- Ge, Z., Li, X., Jiang, T., & Huang, T. (2011). Optimal design for step-stress accelerated degradation testing based on D-optimality. Proceedings of Annual Reliability and Maintainability Symposium, Lake Buena Vista, FL, 1–6.
- Ge, Z., Li, X., Zhang, J., & Jiang, T. (2010). Planning of step-stress accelerated degradation test with stress optimization. Advanced Materials Research, 118–120, 404–408.
- Guan, Q., & Tang, Y. (2013). Optimal design of accelerated degradation test based on gamma process models. Chinese Journal of Applied Probability and Statistics, 29, 213–224.
- Kielpinski, T. J., & Nelson, W. (1975). Optimum censored accelerated life tests for normal and lognormal life distributions. IEEE Transactions on Reliability, 24, 310–320.
- Kvam, P., & Lu, J. C. (2006). Statistical reliability with applications. In Pham H. (Ed.), Springer Handbook of Engineering Statistics (pp. 49–61). London: Springer-Verlag.
- Li, X., & Jiang, T. (2009). Optimal design for step-stress accelerated degradation testing with competing failure modes. Proceedings of Annual Reliability and Maintainability Symposium, Fort Worth, TX, 64–68.
- Liao, C. M., & Tseng, S. T. (2006). Optimal design for step-stress accelerated degradation tests. IEEE Transactions on Reliability, 55, 59–66.
- Liao, H., & Elsayed, E. A. (2006). Reliability inference for field conditions from accelerated degradation testing. Naval Research Logistics, 53, 576–587.
- Lim, H., & Yum, B. J. (2011). Optimal design of accelerated degradation tests based on Wiener process models. Journal of Applied Statistics, 38, 309–325.
- Meeker, W. Q., & Escobar, L. A. (1998). Statistical Methods for Reliability Data. New York: Wiley.
- Meeker, W. Q. (1984). A comparison of accelerated life test plans for Weibull and lognormal distributions and type I censoring. Technometrics, 26, 157–171.
- Nelson, W., (1990). Accelerated Testing: Statistical Method, Test Plans, and Data Analyses. Hoboken, New York: Wiley-Interscience.
- Onar, A., & Padgett, W.J. (2000). Accelerated test models with the inverse Gaussian distribution. Journal of Statistical Planning and Inference, 89, 119–133.
- Pan, Z., & Balakrishnan, N. (2010). Multiple-steps step-stress accelerated degradation modeling based on Wiener and gamma processes. Communications in Statistics - Simulation and Computation, 39, 1384–1402.
- Pan, Z., & Sun, Q. (2014). Optimal design for step-stress accelerated degradation test with multiple performance characteristics based on gamma processes. Communications in Statistics - Simulation and Computation, 43, 298–314.
- Pan, Z. Q., Zhou, J. L., & Peng, B. H. (2009). Optimal design for accelerated degradation tests with several stresses based on Wiener process. Systems Engineering - Theory & Practice, 29, 64–71.
- Park, C., & Padgett, W. J. (2007). Cumulative damage models for failure with several accelerating variables. Quality Technology & Quantitative Management, 4, 17–34.
- Park, J. I., & Yum, B. J. (1997). Optimal design of accelerated degradation tests for estimating mean lifetime at the use condition. Engineering Optimization, 28, 199–230.
- Tang, L. C., Yang, G. Y., & Xie, M. (2004). Planning of step-stress accelerated degradation test. Proceedings of Annual Reliability and Maintainability Symposium, Los Angeles, CA, 287–292.
- Tsai, T. R., Lio, Y. L., & Jiang, N. (2014). Optimal decisions on the accelerated degradation test plan under the Wiener process. Quality Technology & Quantitative Management, 11, 461–470.
- Tseng, S. T., Balakrishnan, N., & Tsai, C. C. (2009). Optimal step-stress accelerated degradation test plan for gamma degradation processes. IEEE Transactions on Reliability, 58, 611–618.
- Ye, Z. S., Chen, L. P., Tang, L. C., & Xie, M. (2014). Accelerated degradation test planning using the inverse Gaussian process. IEEE Transactions on Reliability, 63, 750–763.
- Ye, Z. S., Wang, Y., Tsui, K. L., & Pecht, M. (2013). Degradation data analysis using Wiener processes with measurement errors. IEEE Transactions on Reliability, 62, 772–780.
- Zhang, H., Chen, Y., & Kang, R. (2010). Optimal design of step stress accelerated degradation test and reliability assessment for quartz flexible accelerometers. Proceedings of Annual Reliability and Maintainability Symposium, San Jose, CA, 1–6.