232
Views
4
CrossRef citations to date
0
Altmetric
Articles

Optimal design of step-stress accelerated degradation tests based on the Wiener degradation process

&
Pages 367-393 | Accepted 10 May 2016, Published online: 10 Jul 2016

References

  • Bhattacharyya, G. K., & Fries, A. (1982). Inverse Gaussian regression and accelerated life tests. Lecture Notes-Monograph Series, 2, 101–117.
  • Boulanger, M., & Escobar, L. A. (1994). Experimental design for a class of accelerated degradation tests. Technometrics, 36, 260–272.
  • Chhikara, R. S., & Folks, J. L. (1989). The Inverse Gaussian Distribution. New York: Marcel Dekker.
  • Chiang, J. Y., Lio, Y. L., & Tsai, T. R. (2015). Degradation tests using geometric Brownian motion process for lumen degradation data. Quality and Reliability Engineering International, 31, 1797–1806.
  • Ge, Z., Li, X., Jiang, T., & Huang, T. (2011). Optimal design for step-stress accelerated degradation testing based on D-optimality. Proceedings of Annual Reliability and Maintainability Symposium, Lake Buena Vista, FL, 1–6.
  • Ge, Z., Li, X., Zhang, J., & Jiang, T. (2010). Planning of step-stress accelerated degradation test with stress optimization. Advanced Materials Research, 118–120, 404–408.
  • Guan, Q., & Tang, Y. (2013). Optimal design of accelerated degradation test based on gamma process models. Chinese Journal of Applied Probability and Statistics, 29, 213–224.
  • Kielpinski, T. J., & Nelson, W. (1975). Optimum censored accelerated life tests for normal and lognormal life distributions. IEEE Transactions on Reliability, 24, 310–320.
  • Kvam, P., & Lu, J. C. (2006). Statistical reliability with applications. In Pham H. (Ed.), Springer Handbook of Engineering Statistics (pp. 49–61). London: Springer-Verlag.
  • Li, X., & Jiang, T. (2009). Optimal design for step-stress accelerated degradation testing with competing failure modes. Proceedings of Annual Reliability and Maintainability Symposium, Fort Worth, TX, 64–68.
  • Liao, C. M., & Tseng, S. T. (2006). Optimal design for step-stress accelerated degradation tests. IEEE Transactions on Reliability, 55, 59–66.
  • Liao, H., & Elsayed, E. A. (2006). Reliability inference for field conditions from accelerated degradation testing. Naval Research Logistics, 53, 576–587.
  • Lim, H., & Yum, B. J. (2011). Optimal design of accelerated degradation tests based on Wiener process models. Journal of Applied Statistics, 38, 309–325.
  • Meeker, W. Q., & Escobar, L. A. (1998). Statistical Methods for Reliability Data. New York: Wiley.
  • Meeker, W. Q. (1984). A comparison of accelerated life test plans for Weibull and lognormal distributions and type I censoring. Technometrics, 26, 157–171.
  • Nelson, W., (1990). Accelerated Testing: Statistical Method, Test Plans, and Data Analyses. Hoboken, New York: Wiley-Interscience.
  • Onar, A., & Padgett, W.J. (2000). Accelerated test models with the inverse Gaussian distribution. Journal of Statistical Planning and Inference, 89, 119–133.
  • Pan, Z., & Balakrishnan, N. (2010). Multiple-steps step-stress accelerated degradation modeling based on Wiener and gamma processes. Communications in Statistics - Simulation and Computation, 39, 1384–1402.
  • Pan, Z., & Sun, Q. (2014). Optimal design for step-stress accelerated degradation test with multiple performance characteristics based on gamma processes. Communications in Statistics - Simulation and Computation, 43, 298–314.
  • Pan, Z. Q., Zhou, J. L., & Peng, B. H. (2009). Optimal design for accelerated degradation tests with several stresses based on Wiener process. Systems Engineering - Theory & Practice, 29, 64–71.
  • Park, C., & Padgett, W. J. (2007). Cumulative damage models for failure with several accelerating variables. Quality Technology & Quantitative Management, 4, 17–34.
  • Park, J. I., & Yum, B. J. (1997). Optimal design of accelerated degradation tests for estimating mean lifetime at the use condition. Engineering Optimization, 28, 199–230.
  • Tang, L. C., Yang, G. Y., & Xie, M. (2004). Planning of step-stress accelerated degradation test. Proceedings of Annual Reliability and Maintainability Symposium, Los Angeles, CA, 287–292.
  • Tsai, T. R., Lio, Y. L., & Jiang, N. (2014). Optimal decisions on the accelerated degradation test plan under the Wiener process. Quality Technology & Quantitative Management, 11, 461–470.
  • Tseng, S. T., Balakrishnan, N., & Tsai, C. C. (2009). Optimal step-stress accelerated degradation test plan for gamma degradation processes. IEEE Transactions on Reliability, 58, 611–618.
  • Ye, Z. S., Chen, L. P., Tang, L. C., & Xie, M. (2014). Accelerated degradation test planning using the inverse Gaussian process. IEEE Transactions on Reliability, 63, 750–763.
  • Ye, Z. S., Wang, Y., Tsui, K. L., & Pecht, M. (2013). Degradation data analysis using Wiener processes with measurement errors. IEEE Transactions on Reliability, 62, 772–780.
  • Zhang, H., Chen, Y., & Kang, R. (2010). Optimal design of step stress accelerated degradation test and reliability assessment for quartz flexible accelerometers. Proceedings of Annual Reliability and Maintainability Symposium, San Jose, CA, 1–6.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.