An evaluation of the extrinsic cells number in a memory array using cross-correlation products and deconvolution: an instance of a microelectronics experimental inverse problem

References

• A. Allan, 2007 ITRS ORTC, 12/5 MakuhariJapan ITRS Public Conference, 2007.
   Google Scholar
• Bestory, C, Marc, F, and Levi, H, 2007. Statistical analysis during the reliability simulation, Microelectr. Reliability 47 (9--11) (2007), pp. 1353–1357.
   Web of Science ®Google Scholar
• Brown, WD, and Brewer, JE, 1998. Nonvolatile Semiconductor Memory Technology: A Comprehensive Guide to Understanding and Using NVSM Devices. New York: Wiley, IEEE Press; 1998.
   Google Scholar
• Brown, WD, and Brewer, JE, 2008. Nonvolatile Memory Technologies with Emphasis on Flash: A Comprehensive Guide to Understanding and Using Flash Memory Devices. New York: IEEE Press Series on Microelectronic Systems, Wiley, IEEE Press; 2008.
   Google Scholar
• Cappelletti, P, Golla, C, Olivo, P, and Zanoni, E, 1999. Flash Memories. Dordrecht: Kluwer Academic Publishers; 1999.
   Google Scholar
• Cappelletti, F, Bez, R, Cantarelli, D, Nahmad, D, and Ravazzi, L, 1997. CAST: An electrical stress test to monitor single bit failures in FLASH-EEPROM structures, Microelectr. Reliability 37 (1997), pp. 473–481.
   Web of Science ®Google Scholar
• Pio, F, and Gomiero, E, 2000. Cell array structure test in EEPROM reliability assessment at an early process development stage, Microelectr. Reliability 40 (2000), pp. 719–722.
   Web of Science ®Google Scholar
• Monzio, C, Ielmini, D, Spinelli, AS, Lacaita, AL, and Gerardi, C, 2004. Study of nanocrystal memory reliability by CAST structures, Solid-State Electr. 48 (9) (2004), pp. 1497–1502.
   Web of Science ®Google Scholar
• Pio, F, and Gomiero, E, 2001. Select transistor modulated cell array structure test application in EEPROM process reliability, Solid-State Electr. 45 (2001), pp. 1279–1291.
   Web of Science ®Google Scholar
• Ulmer, W, and Kaissi, W, 2003. The inverse problem of a Gaussian convolution and its application to the finite size of the measurement chambers/detectors in photon and proton dosimetry, Phys. Med. Biol. 48 (2003), pp. 707–727.
   PubMed Web of Science ®Google Scholar
• Ulmer, W, 2010. Inverse problem of linear combination of Gaussian convolution kernels (deconvolution) and some applications to proton/photon dosimetry and image processing, Inverse Probl. 26 (2010), pp. 085002.1–085002.26.
   Web of Science ®Google Scholar
• Le Roux, C, Lopez, L, Firiti, A, Ogier, JL, Lalande, F, Laffont, R, and Micolau, G, 2007. A new method to quantify retention-failed cells of an EEPROM CAST, Microelectr. Reliability 47 (2007), pp. 1609–1613.
   Web of Science ®Google Scholar
• Le Roux, C, Lopez, L, Firiti, A, Ogier, JL, Lalande, F, Laffont, R, and Micolau, G, 2008. An experimental method allowing quantifying and localizing failed cells of an EEPROM CAST after a retention test, Solid-State Electr. 52 (10) (2008), pp. 1550–1554.
   Web of Science ®Google Scholar
• Kolzer, J, Boit, C, Dallmann, A, Deboy, G, Otto, J, and Weinmann, D, 1992. Quantitative emission microscopy, J. Appl. Phys. 70 (1992), pp. 23–41.
   Google Scholar
• Aziza, H, Plantier, J, Portal, JM, Reliaud, C, and Ginez, O, 2008. "A novel Flash EEPROM Diagnosis Methodology based on I-V Signatures Extraction". In: Proceedings of the NVMTS'08. California: Pacific Grove; 2008. pp. 105–110.
   Google Scholar
• Jackson, JD, 1975. Classical Electrodynamics. New York: Wiley; 1975.
   Google Scholar
• Morhac, M, and Matousek, V, 2005. Exact algorithm of multidimensional circulant deconvolution, Appl. Math. Comput. 164 (1) (2005), pp. 155–166.
   Web of Science ®Google Scholar
• Oppenheim, AV, and Schafer, RW, 1989. Discrete-Time Signal Processing. Englewood Cliffs, NJ: Prentice-Hall; 1989.
   Google Scholar
• Chew, WC, and Wang, YM, 1990. Reconstruction of two-dimensional permittivity distribution using the distorted Born iterative method, IEEE Trans. Med. Imag. 9 (1990), pp. 218–225.
   PubMed Web of Science ®Google Scholar
• Saillard, M, Vincent, P, and Micolau, G, 2000. Reconstruction of buried objects surrounded by small inhomogeneities, J. Inverse Probl. 16 (2000), pp. 1195–1208.
   Web of Science ®Google Scholar
• Laffont, R, Masson, P, Bernardini, S, Bouchakour, R, and Mirabel, JM, 2003. A new floating gate compact model applied to flash memory cell, J. Non-Crystal. Solids 322 (1--3) (2003), pp. 250–255.
   Web of Science ®Google Scholar