References
- Wolfe , D.A. 1977 . On the class of partially sequential two-sample test procedures . J. Amer. Statist. Assoc. , 72 : 202 – 205 .
- Orban , J. and Wolfe , D.A. 1980 . Distribution-free partially sequential placement procedures . Communications in Statistics, Series A , 9 : 883 – 904 .
- Orban , J. and Wolfe , D.A. 1982 . A class of distribution free two-sample tests based on placements . J. Amer. Statist. Assoc. , 77 : 666 – 671 .
- Chatterjee , S.K. and Bandyopadhyay , U. 1984 . Inverse sampling based on general scores for nonparametric two-sample problems . Calcutta Statistical Association Bulletin , 33 : 35 – 58 .
- Randles , R.H. and Wolfe , D.A. 1979 . Introduction to the Theory of Nonparametric Statistics John Wiley and Sons .
- Hjort , N.L. and Fenstad , G. 1992 . On the last time and the number of times an estimator is more than ε from its target value . Ann. Statist. , 20 : 469 – 489 .
- Khan , R.A. 1998 . Fixed-width confidence sequences for the normal mean and binominal probability . Sequential Analysis , 17 : 205 – 217 .
-
Hjort
,
N.L.
and
Fenstad
,
G.
1990
.
On the Last ‘n’ Where
Statistical Research Report, Institute of Mathematics Norway : University of Oslo .
- Ghosh , M. , Mukhopadhyay , N. and Sen , P.K. 1997 . Sequential estimation John Wiley and Sons, Inc. .
- Williams , G.W. and Sen , P.K. 1973 . Asymptotically optical sequential estimation of regular functionals of several distributions based on generalized U-statistics . J. Mult. Anal. , 3 : 469 – 482 .
- Williams , G.W. and Sen , P.K. 1974 . On bounded maximum width sequential confidence ellipsoids based on generalized U-statistics . J. Mult. Anal. , 4 : 453 – 468 .
- Rao , C.R. 1973 . Linear Statistical Inference and its Application, , 2nd Ed. John Wiley and Sons .
- Sen , P.K. 1976 . On weak convergence of a tail sequence of martingales . Sankhya Series A , 38 : 190 – 193 .
- Sen , P.K. 1981 . Sequential Nonparametrics New York : John Wiley and Sons .
- Parthasarathy , K.R. 1967 . Probability Measures in Metric Spaces New York : Academic Press .