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Journal of Adhesion Science and Technology Volume 10, 1996 - Issue 10
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Articles

Surface characterization of a semiconductor SiGe/Si heterostructure by contact angle measurements

E. Fadda France Telecom/CNET Grenoble, Chemin du vieux chêne, BP 98, 38243 Meylan Cedex, France
,
P. Warren France Telecom/CNET Grenoble, Chemin du vieux chêne, BP 98, 38243 Meylan Cedex, France
,
F. Chollet France Telecom/CNET Grenoble, Chemin du vieux chêne, BP 98, 38243 Meylan Cedex, France
&
M. Berenguer France Telecom/CNET Grenoble, Chemin du vieux chêne, BP 98, 38243 Meylan Cedex, France
Pages 1067-1074 | Published online: 02 Apr 2012

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