69
Views
8
CrossRef citations to date
0
Altmetric
Articles

Susceptibility of CMOS IC Devices Under Narrow-Band High Power Electromagnetic Waves by Magnetron

, &
Pages 571-582 | Published online: 03 Apr 2012

References

  • Camp , M. , Garbe , H. and Nitsch , D. 2002 . Influence of the technology on the destruction effects of semiconductors by impact of EMP and UWB pulses . 2002 IEEE International Symposium on Electromagnetic Compatibility , 1 : 87 – 92 .
  • Nitsch , D. , Camp , M. , Sabath , F. , ter Haseborg , J. L. and Garbe , H. 2004 . Susceptibility of some electronic equipment to HPEM threats . IEEE Transactions on Electromagnetic Compatibility , 46 ( 3 ) : 380 – 389 .
  • Korte , S. , Camp , M. and Garbe , H. 2005 . Hardware and software simulation of transient pulse impact on integrated circuits . 2005 IEEE International Symposium on Electromagnetic Compatibility , 2 : 489 – 494 .
  • Hwang , S. M. , Hong , J. I. and Huh , C. S. 2008 . Characterization of the susceptibility of integrated circuits with induction caused by high power microwaves . Progress In Electromagnetics Research , PIER 81 : 61 – 72 .
  • Hong , J. I. , Hwang , S. M. and Huh , C. S. 2008 . Susceptibility of microcontroller devices due to coupling effects under narrowband high power electromagnetic waves by magnetron . Journal of Electromagnetic Waves and Applications , 22 : 2451 – 2462 .
  • Giri , D. V. 2004 . High-power Electromagnetic Radiators Nonlethal Weapons and Other Applications , Cambridge, Massachusetts, and London , , England : Harvard University Press .
  • Taylor , C. D. and Giri , D. V. 1994 . High-Power Microwave Systems and Effects , Washington D.C : Tayloer & Francis .
  • Golestani-Rad , L. and Rashed-Mohassel , J. 2006 . Reconfiguration of personal computers internal equipment for improved protection due against penetrating EM pulses . Journal of Elelctromagnetic Waves and Applications , 20 ( 5 ) : 677 – 688 .
  • Golestani-Rad , L. , Rashed-Mohassel , J. and Danaie , M. M. 2006 . Rigorous analysis of EM-wave penetration into a typical room using FDTD method: The transfer function concept . Journal of Elelctromagnetic Waves and Applications , 20 ( 7 ) : 913 – 926 .
  • Wang , Y. J. , Koh , W. J. , Lee , C. K. and See , K. Y. 2002 . Electromagnetic coupling analysis of transient signal through slots or apertures perforated in a shielding metallic enclosure using FDTD methodology . Progress In Electromagnetics Research , PIER 36 : 247 – 264 .
  • Sharaa , I. , Aloi , D. N. and Gerl , H. P. 2009 . EMC model-based test-setup of an electrical system . Progress In Electromagnetics Research B , 11 : 133 – 154 .
  • Giri , D. V. and Tesche , F. M. 2004 . Classification of intentional electromagnetic environments (IEME) . IEEE Transaction on Electromagnetic Compatibility , 46 ( 3 ) : 322 – 328 .
  • Soliman , M. S. , Morimoto , T. and Kawasaki , Z. I. 2006 . Threedimensional localization system for impulsive noise sources using ultra-wideband digital interferometer technique . Journal of Elelctromagnetic Waves and Applications , 20 ( 4 ) : 515 – 530 .
  • Wang , H. , Li , J. , Li , H. , Xiao , K. and Chen , H. 2008 . Experimental study and spice simulation of CMOS inverters latch-up effects due to high power microwave interference . Progress In Electromagnetics Research , PIER 87 : 313 – 330 .
  • Amerasekera , E. A. and Najm , F. N. 1997 . Failure Mechanisms in Semiconductor Devices , Second Edition , John Wiley & Sons .
  • Mats , G. B. and Karl , G. L. 2004 . Susceptibility of electronic systems to high-power microwaves: Summary of test experience . IEEE Transactions on Electromagnetic Compatibility , 46 ( 3 ) : 396 – 403 .
  • Voldman , S. H. 1998 . The impact of technology scaling on ESD robustness of aluminum and copper interconnects in advanced semiconductor technologies . IEEE Transactions on Components, Packaging and Manufacturing Technology , 21 ( 4 ) : 265 – 277 .

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.