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Materials Science and Technology Volume 26, 2010 - Issue 6: Applications of electron backscatter diffraction
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Articles

New method to characterise grain boundary plane orientations based on EBSD orientation microscopy for serial sectioned surfaces

C. T. ChouOxford Instruments Analytical LtdHalifax Road, High Wycombe, Buckinghamshire HP12 3SE, UK;, Email: [email protected]
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A. GholiniaOxford Instruments Analytical LtdHalifax Road, High Wycombe, Buckinghamshire HP12 3SE, UK, School of Materials, University of Manchester, Grosvenor Street, Manchester M1 7HS, UK
Pages 650-660 | Published online: 19 Jul 2013

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