REFERENCES
- H. O. Peitgen, J. M. Henriques and L. F. Penedo: ‘Fractals in the fundamental and applied sciences’; 1991, New York, Elsevier Science Publishing Company Inc.
- J. Crilly, R. A. Earnshaw and H. Jones: ‘Fractals and chaos’; 1991, New York, Springer-Verlag.
- M. F. Barnsley and S. Demko: Proc. Roy. Soc. London, 1985, A399, 243–275.
- E. Jacquin: IEEE Trans. Signal Process., 1992, 1, (1), 18–30.
- E. W. Jacobs, Y. Fisher and R. D. Boss: IEEE Trans. Signal Process., 1992, 29, (3), 251–263.
- M. F. Barnsley: US patent No. 4, 941, 193, 1990.
- S. Graf: J. Complexity, 1992, 8, 72–78.
- M. F. Barnsley and A. D. Sloan: BYTE Magazine, 1988, 215–233.
- Y. Fisher: ‘Fractal image compression, theory and application’; 1994, New York, Springer-Verlag.
- B. Wohlberg and G. de Jager: IEEE Trans. Image Process., 1999, 8, (12), 1716–1729.
- M. Polvere and M. Nappi: IEEE Trans. Image Process., 2000, 9, (6), 1002–1009.
- Z. Wang, D. Zhang and Y. Yu: Signal Processing: Image Communication, 2000, 15, 767–779.
- C. K. Lee and W. K. Lee: IEEE Trans. Image Process., 1998, 7, (6), 888–891.
- C. M. Lai, K. M. Lam and W. C. Siu: IEEE Trans. Image Process., 2003, 12, (11), 1398–1403.
- T. K. Truong, J. H. Jeng, I. S. Reed, P. C. Lee and A. Q. Li: IEEE Trans. Image Process., 2000, 9, (4), 529–535.
- Z. Wang, A. C. Bovik, H. R. Sheihk and E. O. Simocelli: IEEE Trans. Image Process., 2004, 13, (1), 114.