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Technical Paper

A Unique Beryllium Carbide Thin Film: Synthesis, Chemical, and Thermal Characterizations

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Pages 384-390 | Published online: 09 May 2017

References

  • J. P. Holdren, R. W. Conn, D. MacArther, L. T. Papay, C. Prager, A. M. Sessler, H. Socolow, C. M. Vest, and L. S. Wu; J. Fusion Energy, 14(2), 213, 1995.
  • F. Viedlander, etc., Nuclear and Radiochemistry, John Wiley, New York, 547–548, 1981.
  • K. R. Schultz, J. Fusion Energy, 14(2), 187, 1995.
  • G. W. Collins, S. A. Letts, E. M. Fearon, R. McEachern, and T. P. Bernat; Phys. Rev. Lett., 3(5), 708, 1994.
  • E. M. Fearon, S. A. Letts, L. M. Allison, and R. C. Cook, Fusion Technol., 31, 406, 1997.
  • R. Brussasco, T. Dithrich, and R. Cook; Fusion Technol. 28. 1854, 1995.
  • S. A. Letts, R. C. Cook, P. Welch, R. McEachern, and E. Fearon; Polymer, Preprints, 34(1), 677, 1993.
  • R. Brusasco, S. A. Letts, P. Miller, M. Saculla, and R. Cook; J. Vac. Sci. Technol., A 14(3), 1019, 1996.
  • R. K. Janer, Physica Scripta, T62, 5(i), 1996.
  • K. Othmer, Concise Encyclopedia of Chemical Technology, A Wiley-Interscience Publishing, 164, 1985.
  • Encyclopedia of Chemical Technology, A Wiley-Interscience Publishing, 3, 804, 1978.
  • R.M. C. Eachern, C. Alford, R. Cook, D. Makowiecki, and R. Wallace, Fusion Tech., 31, 435, 1997.
  • M. Dalle. Donne, U. Fischer, M. Küchle, Nuclear Technol., 71(10), 15, 1985.
  • M. Weberpals, J. Hackman, C. Nieswand, and J. Uhlenbusch; Plasma Phys. And Controlled Fusion, 30(4), 407, 1988.
  • U. Fischer, Fusion Technol., 13(1), 143, 1988.
  • R. E. Nygren, M. F. Smith; Fusion Technol., 19, 2092, 1991.
  • K. J. Dietz, Fusion Technol., J9, 2031, 1991.
  • W. Eckstein, J. Roth, E. Ganthier, and J. LáSzló; Fusion Technol., 19, 2076, 1991.
  • J. V. Vosen and W. Kern, Thin Film Processes, Academic Press, New York, 1978.
  • T. D. Manti, and T. E. Wicker; Solid State Technol., 28(4), 263, 1985.
  • B. Windows, F. Sharpies, and N. Savvides; J. Vac. Sci. Technol., A3, 2368, 1985.
  • N. C. Morosoff, W. Newton, and H. Yasuda; J. Vac. Sci. Technol., 15, 1815, 1978.
  • L. J. Dimmey, P. L. Jones, and F. H. Cocks; Thin Solid Films, 67, LI3, 1980.
  • M. Taniguchi, M. Hirose, T. Hamasaki, and Y. Osaka; Appl. Phys. Lett., 37, 787, 1980.
  • W. S. Shih, N. E. Barr, Y. Xie, W. J. James, N. C. Morosoff, and R. B Stephens; Fusion Technol., 31(4), 442, 1997.
  • N. C. Morosoff, N. E. Barr, W. J. James, and R. B. Stephens; 12th International Symposium on Plasma Chemistry, Aug. 21–25, 1995, Minneapolis, MN.
  • R. Brusasco, S. A. Letts, P. Miller, M. Saculla, and R. Cook; J. Vac. Sci. Technol., A 14(3), 1019, 1996.
  • D. R. Lide, CRC Handbook of Chem. and Phys. 72nd Ed., CRC Press, pp. 4–44, 5-1, 5-6, 12-33, 12-119, 1991-1992.
  • T. G. Nieh, J. Wadswath, and A. Joshi; Scripta Met. 20, 87, 1986.
  • F. Arezzo, N. Zacchetti, and W. Zhu; J. Appl. Phys., 75(10), 5375, 1994.
  • F. R. McFeely, S. P. Kowalczyk, L. Lay, R. G. Carell, R. A. Pollak, and D. A. Shirley; Phys., Rev., B 9, 5268, 1974.
  • E. Koch, and W. Fischer; Institut für Mineralogie, Petrologie und Kristallographie, Philipps-Universität, Marburg, Germany
  • D. N. Belton, S. J. Harris, S. J. Schmieg, A. M. Weiner, and T. A. Perry; Phys. Lett., 54, 416, 1989.
  • J. F. Quick; Reactor Handbook, Materials, MacGraw-Hill Book Co., New York, 95, 97, 98, 1955.
  • B. D. Cullity, Elements of X-ray Diffraction, 2nd Ed., Addison-Wesley Publishing, 102, 295, 340, 1978.

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