A Geant4-based Monte Carlo study of a benchtop multi-pinhole X-ray fluorescence computed tomography imaging

Luzhen Deng1 Key Laboratory of Optoelectronics Technology and System, Chongqing University, Ministry of Education, Chongqing 400044, China, [email protected];2 Department of Radiation Physics, The University of Texas MD Anderson Cancer Center, Houston, TX 77030, USA

Biao Wei1 Key Laboratory of Optoelectronics Technology and System, Chongqing University, Ministry of Education, Chongqing 400044, China, [email protected]

Peng He1 Key Laboratory of Optoelectronics Technology and System, Chongqing University, Ministry of Education, Chongqing 400044, China, [email protected];3 Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Chongqing University, Ministry of Education, Chongqing 400044, Chinal, [email protected]

Yi Zhang4 College of Computer Science, Sichuan University, Chengdu 610065, China

Peng Feng1 Key Laboratory of Optoelectronics Technology and System, Chongqing University, Ministry of Education, Chongqing 400044, China, [email protected];3 Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Chongqing University, Ministry of Education, Chongqing 400044, Chinal, [email protected]Correspondence[email protected]

Pages 7207-7216 | Published online: 08 Nov 2018

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