Supplemental material
Materials Research Letters
Volume 9, 2021 - Issue 2
Original Reports
Microstructural evolution of nanotwinned Al-Zr alloy with significant 9R phase
N. A. Richtera School of Materials Engineering, Purdue University, West Lafayette, IN, USA
https://orcid.org/0000-0003-3273-2276View further author information
https://orcid.org/0000-0003-3273-2276View further author information, Y. F. Zhanga School of Materials Engineering, Purdue University, West Lafayette, IN, USAhttps://orcid.org/0000-0002-5544-7534View further author information
https://orcid.org/0000-0002-5544-7534View further author information, , R. Sua School of Materials Engineering, Purdue University, West Lafayette, IN, USAhttps://orcid.org/0000-0003-1183-3641View further author information
https://orcid.org/0000-0003-1183-3641View further author information, Q. Lia School of Materials Engineering, Purdue University, West Lafayette, IN, USAhttps://orcid.org/0000-0001-5442-259XView further author information
https://orcid.org/0000-0001-5442-259XView further author information, S. Xuea School of Materials Engineering, Purdue University, West Lafayette, IN, USAhttps://orcid.org/0000-0002-8445-8718View further author information
https://orcid.org/0000-0002-8445-8718View further author information, , J. Wangb Mechanical and Materials Engineering, University of Nebraska-Lincoln, Lincoln, NE, USAhttps://orcid.org/0000-0001-5130-300XView further author information
https://orcid.org/0000-0001-5130-300XView further author information, H. Wanga School of Materials Engineering, Purdue University, West Lafayette, IN, USA;c School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, USAhttps://orcid.org/0000-0002-7397-1209View further author information
https://orcid.org/0000-0002-7397-1209View further author information & X. Zhanga School of Materials Engineering, Purdue University, West Lafayette, IN, USACorrespondence[email protected]
https://orcid.org/0000-0002-8380-8667View further author information
https://orcid.org/0000-0002-8380-8667View further author information show all