Critical Reviews in Solid State and Materials Sciences, Volume 25, Issue 1 (2000)

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Critical Reviews in Solid State and Materials Sciences, Volume 25, Issue 1 (2000)

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Original Articles

Article
Nanometer Scale Electrical Characterization of Artificial Mesostructures
C. Durkan & M. E. Welland
Pages: 1-28
Published online: 24 Jun 2010
AbstractforNanometer Scale Electrical Characterization of Artificial Mesostructures | PDF (903.5 KB)
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Article
Thin-Film Electroluminescent Device Physics Modeling
J. C. Hitt, J. P. Bender & J. F. Wager
Pages: 29-85
Published online: 24 Jun 2010
AbstractforThin-Film Electroluminescent Device Physics Modeling | PDF (1 MB)
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