Philosophical Magazine A, Volume 54, Issue 6 (1986)

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Philosophical Magazine A, Volume 54, Issue 6 (1986)

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Original Articles

Article
Internal friction in KCl single crystals
M. Tanibayashi & J. L. Tallon
Pages: 743-758
Published online: 04 Oct 2006
AbstractforInternal friction in KCl single crystals | References | PDF (813.7 KB)
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Article
Theoretical studies of diffusion processes down coincident tilt boundaries in NiO
D. M. Duffy & P. W. Tasker
Pages: 759-771
Published online: 04 Oct 2006
AbstractforTheoretical studies of diffusion processes down coincident tilt boundaries in NiO | References | PDF (722.5 KB)
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Article
The phenomenological coefficients for atom transport in a random alloy
Y. Okamura & A. R. Allnatt
Pages: 773-782
Published online: 04 Oct 2006
AbstractforThe phenomenological coefficients for atom transport in a random alloy | References | PDF (507.1 KB)
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Article
Effect of prestrain on the strength anomaly in β-brass
Y. M. Zhu & H. Saka
Pages: 783-792
Published online: 04 Oct 2006
AbstractforEffect of prestrain on the strength anomaly in β-brass | References | PDF (1.9 MB)
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Article
Computer simulation of twin boundaries in the h.c.p. metals
A. Serra & D. J. Bacon
Pages: 793-804
Published online: 04 Oct 2006
AbstractforComputer simulation of twin boundaries in the h.c.p. metals | References | PDF (573.4 KB)
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Article
On the occurrence of multiply twinned particles in electrodeposited nickel films
C. R. Hall & S. A. H. Fawzi
Pages: 805-820
Published online: 04 Oct 2006
AbstractforOn the occurrence of multiply twinned particles in electrodeposited nickel films | References | PDF (3.4 MB)
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Article
Microtwin formation in deformed nickel
I. M. Robertson
Pages: 821-835
Published online: 04 Oct 2006
AbstractforMicrotwin formation in deformed nickel | References | PDF (3.6 MB)
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Article
In situ oxidation processes for In III-V compound semiconductors studied by high-resolution electron microscopy
Amanda K. Petford-long & David J. Smith
Pages: 837-850
Published online: 04 Oct 2006
AbstractforIn situ oxidation processes for In III-V compound semiconductors studied by high-resolution electron microscopy | References | PDF (4.2 MB)
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Article
Mechanism for void nucleation at a carbide/matrix interface
B. A. Senior
Pages: 851-856
Published online: 04 Oct 2006
AbstractforMechanism for void nucleation at a carbide/matrix interface | References | PDF (311 KB)
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