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Paul-Arthur Dreyfus, Foivos Psarommatis, Gokan May & Dimitris Kiritsis. (2022) Virtual metrology as an approach for product quality estimation in Industry 4.0: a systematic review and integrative conceptual framework. International Journal of Production Research 60:2, pages 742-765.
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Haw-Ching Yang, Hao Tieng & Fan-Tien Cheng. (2016) Automatic virtual metrology for wheel machining automation. International Journal of Production Research 54:21, pages 6367-6377.
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Haw-Ching Yang, Hao Tieng & Fan-Tien Cheng. (2016) Total precision inspection of machine tools with virtual metrology. Journal of the Chinese Institute of Engineers 39:2, pages 221-235.
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Articles from other publishers (6)
Yaxuan Zhang, Li Li & Qingyun Yu. (2024) Virtual metrology for enabling zero-defect manufacturing: a review and prospects. The International Journal of Advanced Manufacturing Technology 130:7-8, pages 3211-3227.
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Chen-Fu Chien, Tran Hong Van Nguyen, Yi-Chiu Li & Ying-Jen Chen. (2023) Bayesian decision analysis for optimizing in-line metrology and defect inspection strategy for sustainable semiconductor manufacturing and an empirical study. Computers & Industrial Engineering 182, pages 109421.
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Fan‐Tien Cheng, Yu‐Chen Chiu, Yu‐Ming Hsieh, Hao Tieng, Chin‐Yi Lin & Hsien‐Cheng Huang. 2021. Industry 4.1. Industry 4.1
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Fan-Tien Cheng, Hao Tieng, Haw-Ching Yang, Min-Hsiung Hung, Yu-Chuan Lin, Chun-Fan Wei & Zih-Yan Shieh. (2016) Industry 4.1 for Wheel Machining Automation. IEEE Robotics and Automation Letters 1:1, pages 332-339.
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Yao-Sheng Hsieh, Fan-Tien Cheng, Chun-Fang Chen, Jhao-Rong Lyu & Ting-Yu Lin. (2015) Dynamic ISD scheme for the AVM system - a preliminary study. Dynamic ISD scheme for the AVM system - a preliminary study.