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Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 2, 1970 - Issue 1
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Notes on the Evolution of Acceptance Sampling Plans Part IV

H. F. DodgeRutgers University, New Brunswick, New JerseyView further author information
Pages 1-8 | Published online: 27 Feb 2018

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Read on this site (7)

DeanV. Neubauer & StephenN. Luko. (2012) Comparing Acceptance Sampling Standards, Part 1. Quality Engineering 25:1, pages 73-77.
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K. Govindaraju & C. Kandasamy. (2000) Design of generalized CSP-C continuous sampling plan. Journal of Applied Statistics 27:7, pages 829-841.
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Tommy Wright & How Tsao. (1985) Some Useful Notes on Simple Random Sampling. Journal of Quality Technology 17:2, pages 67-73.
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Burton S. Liebesman & Bernard Saperstein. (1983) A Proposed Attribute Skip-Lot Sampling Program. Journal of Quality Technology 15:3, pages 130-140.
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JosephW. Foster & OscarT. Perry. (1977) Price Adjusted Single Sampling with Quadratic Indifference. A I I E Transactions 9:1, pages 88-94.
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Edward P. C. Kao. (1972) Economic Screening of a Continuously Manufactured Product. Technometrics 14:3, pages 653-661.
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Joseph W. Foster & Oscar T. Perry. (1972) Price Adjusted Single Sampling with Linear Indifference. Journal of Quality Technology 4:3, pages 134-144.
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Articles from other publishers (5)

Rainer Göb. 2014. Wiley StatsRef: Statistics Reference Online. Wiley StatsRef: Statistics Reference Online.
Rainer Göb. 2007. Encyclopedia of Statistics in Quality and Reliability. Encyclopedia of Statistics in Quality and Reliability.
S. BALAMURALI, M. KALYANASUNDARAM & CHI-HYUCK JUN. (2011) GENERALIZED CSP-(C 1 , C 2 ) SAMPLING PLAN FOR CONTINUOUS PRODUCTION PROCESSES . International Journal of Reliability, Quality and Safety Engineering 12:02, pages 75-93.
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Rainer Göb. (1996) An elementary model for statistical lot inspection and its application to sampling by variables. Metrika 44:1, pages 135-163.
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Reay-Chen Wang & Chung-Ho Chen. (1994) Minimum AFI for CSP-2 plan under inspection error. Computers & Industrial Engineering 26:4, pages 775-785.
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