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Philosophical Magazine A Volume 45, 1982 - Issue 4
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Original Articles

High-resolution lattice imaging of cadmium telluride

T. Yamashita Department of Materials Science and Engineering, Stanford University, Stanford, California, 94305, U.S.A.
,
F. A. Ponce Department of Materials Science and Engineering, Stanford University, Stanford, California, 94305, U.S.A.
,
P. Pirouz Department of Materials Science and Engineering, Stanford University, Stanford, California, 94305, U.S.A.; Department of Metallurgy and Science of Materials, University of Oxford, Parks Road, Oxford, Oxon, 0X1 3PH, England
&
R. Sinclair Department of Materials Science and Engineering, Stanford University, Stanford, California, 94305, U.S.A.
Pages 693-711 | Received 06 Mar 1981, Accepted 10 Aug 1981, Published online: 20 Nov 2006

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K. Watanabe, N. Hashikawa, K. Hiratsuka, K. Nakamura, C. Tsuruta, H. Yamaguchi & I. Hashimoto. (1992) Lattice images of narrow-bandgap semiconductors: InP, InAs and InSb. Philosophical Magazine B 66:5, pages 573-585.
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K. Watanabe, K. Hiratsuka & H. Yamaguchi. (1991) (100) Lattice images of GaAs and ZnSe crystals. Philosophical Magazine A 64:1, pages 81-86.
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K. Hiratsuka. (1991) Screening effect on ⟨110⟩ high-resolution electron microscopy image of compound semiconductors. Philosophical Magazine B 63:5, pages 1087-1100.
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DavidJ. Smith, RobW. Glaisher & Ping Lu. (1989) Surface polarity determination in 〈110〉-orientated compound semiconductors high-resolution electron microscopy. Philosophical Magazine Letters 59:2, pages 69-75.
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Y. Kikuchi. (1988) The effect of screening on the lattice images of ZnSe and GaAs. Philosophical Magazine B 57:4, pages 547-556.
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K. Watanabe, K. Hiratsuka, Y. Kikuchi & H. Yamaguchi. (1987) Lattice images of ZnSe crystals. Philosophical Magazine Letters 56:2, pages 51-55.
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Articles from other publishers (15)

Y.X. Cui, Y.M. Wang, C. Wen, B.H. Ge, F.H. Li, Y. Chen & H. Chen. (2013) Determining polarity and dislocation core structures at atomic level for epitaxial AlN/(0 0 0 1)6H-SiC from a single image in HRTEM. Ultramicroscopy 126, pages 77-84.
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Kazuto Watanabe. 1993. Advances in Electronics and Electron Physics Volume 86. Advances in Electronics and Electron Physics Volume 86 173 224 .
F.A. Ponce & H. Hikashi. (2020) Computer-Assisted High-Re Solution TEM. Proceedings, annual meeting, Electron Microscopy Society of America 48:1, pages 162-163.
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P. Pirouz & F. Ernst. 1990. Metal–Ceramic Interfaces. Metal–Ceramic Interfaces 199 221 .
Rob.W. Glaisher, A.E.C. Spargo & David J. Smith. (1989) A systematic analysis of HREM imaging of sphalerite semiconductors. Ultramicroscopy 27:2, pages 131-150.
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Rob.W. Glaisher, A.E.C. Spargo & David J. Smith. (1989) A theoretical analysis of HREM imaging for 〈110〉 tetrahedral semiconductors. Ultramicroscopy 27:1, pages 19-34.
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Y. Kikuchi, K. Watanabe, S. Naitoh, K. Hiratsuka & H. Yamaguchi. (1988) HREM image of a vacancy in copper. Physica Status Solidi (a) 108:2, pages 509-517.
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A. Bourret, J. L. Rouvière & J. Spendeler. (1988) Direct observation of atomic columns in semiconductors by HREM at 400 kV. Physica Status Solidi (a) 107:2, pages 481-501.
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K. Watanabe, Y. Kikuchi & H. Yamaguchi. (1986) Screening Effect on Lattice Images of Silicon. physica status solidi (a) 98:2, pages 409-416.
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Jamie H. Rose & R. Gronsky. (2011) The Potential of High-Resolution Transmission Electron Microscopy for Imaging Impurities at Dislocations and Grain Boundaries in Silicon. MRS Proceedings 62.
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N. Otsuka, L. A. Kolodziejski, R. L. Gunshor, S. Datta, R. N. Bicknell & J. F. Schetzina. (2011) Observation of the CdTe-GaAs Interface by High Resolution Electron Microscopy. MRS Proceedings 37.
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J.L. Hutchison. (1984) High resolution electron microscopy in the study of semiconducting materials. Ultramicroscopy 15:1-2, pages 51-59.
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A. Bourret, J. Thibault‐Desseaux, C. D'Anterroches, J. M. Penisson & A. De Crecy. (2011) Are the core structures of dislocations and grain boundaries resolvable by HREM?. Journal of Microscopy 129:3, pages 337-345.
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Kunio Suzuki, Shin Takeuchi, Masayuki Shino, Koichi Kanaya & Hiroshi Iwanaga. (1983) Lattice Image Observations of Defects in CdS and CdSe. Transactions of the Japan Institute of Metals 24:6, pages 435-442.
Crossref
T. Yamashita & R. Sinclair. (2011) Dynamic Observation of Atomic-Level Events in Cadmium Telluride by High Resolution Tem. MRS Proceedings 14.
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