8,562
Views
63
CrossRef citations to date
0
Altmetric
Miscellany

Operational planning and control of semiconductor wafer production

, , &
Pages 639-647 | Published online: 21 Feb 2007

Keep up to date with the latest research on this topic with citation updates for this article.

Read on this site (10)

Quentin Christ, Stéphane Dauzère-Pérès & Guillaume Lepelletier. (2023) A three-step approach for decision support in operational production planning of complex manufacturing systems. International Journal of Production Research 61:17, pages 5860-5885.
Read now
Geert van Kollenburg, Mike Holenderski & Nirvana Meratnia. (2022) Value proposition of predictive discarding in semiconductor manufacturing. Production Planning & Control 0:0, pages 1-10.
Read now
Mahesh Gupta & Soeren Andersen. (2018) Throughput/inventory dollar-days: TOC-based measures for supply chain collaboration. International Journal of Production Research 56:13, pages 4659-4675.
Read now
Stefan Woerner, Marco Laumanns & Stephan M. Wagner. (2018) Joint optimisation of capacity and safety stock allocation. International Journal of Production Research 56:13, pages 4612-4628.
Read now
You Li, Zhibin Jiang & Wenyou Jia. (2017) API-based two-dimensional dispatching decision-making approach for semiconductor wafer fabrication with operation due date–related objectives. International Journal of Production Research 55:1, pages 79-95.
Read now
Nur Amalina Muhammad, Jeng Feng Chin, Shahrul Kamarrudin, Mohd Azizi Chik & Joshua Prakash. (2015) Fundamental simulation studies of CONWIP in front-end wafer fabrication. Journal of Industrial and Production Engineering 32:4, pages 232-246.
Read now
Seung-Kil Lim, Jae-Gon Kim & Hwa-Joong Kim. (2014) Simultaneous order-lot pegging and wafer release planning for semiconductor wafer fabrication facilities. International Journal of Production Research 52:12, pages 3710-3724.
Read now
Adrián M. Aguirre, Carlos A. Méndez & Pedro M. Castro. (2014) A hybrid scheduling approach for automated flowshops with material handling and time constraints. International Journal of Production Research 52:9, pages 2788-2806.
Read now
L Mönch, J Zimmermann, S J Mason & J W Fowler. (2011) Multiple orders per job formation and release strategies in large-scale wafer fabs: a simulation study. Journal of Simulation 5:1, pages 25-43.
Read now
M. Chen, S.C. Sarin & Andy Peake. (2010) Integrated lot sizing and dispatching in wafer fabrication. Production Planning & Control 21:5, pages 485-495.
Read now

Articles from other publishers (53)

Chuming Sheng, Xiangqi Dong, Yuxuan Zhu, Xinyu Wang, Xinyu Chen, Yin Xia, Zihan Xu, Peng Zhou, Jing Wan & Wenzhong Bao. (2023) Two‐Dimensional Semiconductors: From Device Processing to Circuit Integration. Advanced Functional Materials 33:50.
Crossref
Runliang Dou, Yanchao Hou, Yixin Wei & Jing Liu. (2023) Dual carbon oriented optimization method for manufacturing industry chain based on BP neural network and clonal selection algorithm. Applied Soft Computing 148, pages 110887.
Crossref
Mirna Magdy, Mohamed Grida & Gawaher Hussein. (2023) Disruption mitigation in the semiconductors supply chain by using public blockchains. The Journal of Supercomputing.
Crossref
Shouhong Chen, Yuxuan Zhang, Xingna Hou, Yuling Shang & Ping Yang. (2022) Wafer map failure pattern recognition based on deep convolutional neural network. Expert Systems with Applications 209, pages 118254.
Crossref
José L. Gómez-Sirvent, Francisco López de la Rosa, Roberto Sánchez-Reolid, Rafael Morales & Antonio Fernández-Caballero. (2022) Defect classification on semiconductor wafers using Fisher vector and visual vocabularies coding. Measurement 202, pages 111872.
Crossref
Mukai Mahachi, Honoré Moukala, Abdelgafar Ismail, Anna Hopf & Hans Ehm. (2022) Simulating the COVID19-pandemic and its impact on the semiconductor supply chain: Enabling a supply chain risk management framework. IFAC-PapersOnLine 55:10, pages 2215-2220.
Crossref
Shu-Kai S. Fan, Chun-Wei Cheng & Du-Ming Tsai. (2021) Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes. IEEE Transactions on Automation Science and Engineering, pages 1-15.
Crossref
Robert L. Burdett, Paul Corry, Colin Eustace & Simon Smith. (2021) Scheduling pre-emptible tasks with flexible resourcing options and auxiliary resource requirements. Computers & Industrial Engineering 151, pages 106939.
Crossref
Marco Ratusny, Alican Ay & Thomas Ponsignon. (2020) Characterizing Customer Ordering Behaviors in Semiconductor Supply Chains with Convolutional Neural Networks. Characterizing Customer Ordering Behaviors in Semiconductor Supply Chains with Convolutional Neural Networks.
Joris Werling, Claude Yugma, Ameur Soukhal & Thierry Mohr. (2020) An Agent-Based Simulation Model with Human Resource Integration for Semiconductor Manufacturing Facility. An Agent-Based Simulation Model with Human Resource Integration for Semiconductor Manufacturing Facility.
Patrick C. Deenen, Jelle Adan & Alp Akcay. (2020) Optimizing class-constrained wafer-to-order allocation in semiconductor back-end production. Journal of Manufacturing Systems 57, pages 72-81.
Crossref
Douniel Lamghari-Idrissi, Daniel Soellaart, Rob Basten & Nico Dellaert. (2019) Influence of Spare Parts Service Measures on the Performance of Front-End Wafer Production Process. Influence of Spare Parts Service Measures on the Performance of Front-End Wafer Production Process.
Ines Gold, Hans Ehm, Thomas Ponsignon & Muhammad Tariq Afridi. (2019) Applying Diffusion Models to Semiconductor Supply Chains: Increasing Demand by Funded Projects. Applying Diffusion Models to Semiconductor Supply Chains: Increasing Demand by Funded Projects.
Emna Mhiri, Fabien Mangione, Mireille Jacomino, Philippe Vialletelle & Guillaume Lepelletier. (2018) Heuristic Algorithm for a WIP Projection Problem at Finite Capacity in Semiconductor Manufacturing. IEEE Transactions on Semiconductor Manufacturing 31:1, pages 62-75.
Crossref
Junliang Wang, Jie Zhang & Xiaoxi Wang. (2018) Bilateral LSTM: A Two-Dimensional Long Short-Term Memory Model With Multiply Memory Units for Short-Term Cycle Time Forecasting in Re-entrant Manufacturing Systems. IEEE Transactions on Industrial Informatics 14:2, pages 748-758.
Crossref
Mu-Chen Chen, Yu-Hsiang Hsiao & Hsi-Yuan Huang. (2017) Semiconductor Supply Chain Planning With Decisions of Decoupling Point and VMI Scenario. IEEE Transactions on Systems, Man, and Cybernetics: Systems 47:5, pages 856-868.
Crossref
Martin Plank, Johanna Königer, Mathias Dümmler, Nils Weinert & Christian Mose. 2017. Metamorphose zur intelligenten und vernetzten Fabrik. Metamorphose zur intelligenten und vernetzten Fabrik 161 209 .
Bashar Haddad, Lina Karam, Jieping Ye, Nital Patel & Martin Braun. (2016) Multi-feature sparse-based defect detection and classification in semiconductor units. Multi-feature sparse-based defect detection and classification in semiconductor units.
Mohamad Chakaroun, Mustapha Ouladsine, Mohand Djeziri & Jacques Pinaton. (2016) Reactive Sampling for Efficient Defect Source Identification. IEEE Transactions on Semiconductor Manufacturing 29:2, pages 104-115.
Crossref
Bas J. de Kruif. (2015) Wet-etch sequence optimisation incorporating time dependent chemical maintenance. Wet-etch sequence optimisation incorporating time dependent chemical maintenance.
Mohamad Chakaroun, Mohand Djeziri, Mustapha Ouladsine & Jacques Pinaton. (2015) Defect diagnosis using in line product control data in semiconductor industry. Defect diagnosis using in line product control data in semiconductor industry.
Abdoul Bitar, Stephane Dauzere-Peres & Claude Yugma. (2014) On the importance of optimizing in scheduling: The photolithography workstation. On the importance of optimizing in scheduling: The photolithography workstation.
Jingjing Yuan & Thomas Ponsignon. (2014) Towards a semiconductor supply chain simulation library (SCSC-SIMLIB). Towards a semiconductor supply chain simulation library (SCSC-SIMLIB).
Emna Mhiri, Mireille Jacomino, Fabien Mangione, Philippe Vialletelle & Guillaume Lepelletier. (2014) A step toward capacity planning at finite capacity in semiconductor manufacturing. A step toward capacity planning at finite capacity in semiconductor manufacturing.
Mohamad Chakaroun, Mohand Djeziri, Mustapha Ouladsine & Jacques Pinaton. (2014) Similar sample selection approach based on sequence alignment; application to semiconductor industry. Similar sample selection approach based on sequence alignment; application to semiconductor industry.
Marwa Attiya, Irfan Saadat & Ali Diabat. (2014) Screening scenario-based analysis of modifications in planning of semiconductor manufacturing. Screening scenario-based analysis of modifications in planning of semiconductor manufacturing.
Tsung-Che Chiang. (2013) Enhancing rule-based scheduling in wafer fabrication facilities by evolutionary algorithms: Review and opportunity. Computers & Industrial Engineering 64:1, pages 524-535.
Crossref
Lars Mönch, John W. Fowler & Scott J. MasonLars Mönch, John W. Fowler & Scott J. Mason. 2013. Production Planning and Control for Semiconductor Wafer Fabrication Facilities. Production Planning and Control for Semiconductor Wafer Fabrication Facilities 247 266 .
Lars Mönch, John W. Fowler & Scott J. MasonLars Mönch, John W. Fowler & Scott J. Mason. 2013. Production Planning and Control for Semiconductor Wafer Fabrication Facilities. Production Planning and Control for Semiconductor Wafer Fabrication Facilities 207 246 .
Lars Mönch, John W. Fowler & Scott J. MasonLars Mönch, John W. Fowler & Scott J. Mason. 2013. Production Planning and Control for Semiconductor Wafer Fabrication Facilities. Production Planning and Control for Semiconductor Wafer Fabrication Facilities 177 205 .
Lars Mönch, John W. Fowler & Scott J. MasonLars Mönch, John W. Fowler & Scott J. Mason. 2013. Production Planning and Control for Semiconductor Wafer Fabrication Facilities. Production Planning and Control for Semiconductor Wafer Fabrication Facilities 105 175 .
Lars Mönch, John W. Fowler & Scott J. MasonLars Mönch, John W. Fowler & Scott J. Mason. 2013. Production Planning and Control for Semiconductor Wafer Fabrication Facilities. Production Planning and Control for Semiconductor Wafer Fabrication Facilities 65 104 .
Lars Mönch, John W. Fowler & Scott J. MasonLars Mönch, John W. Fowler & Scott J. Mason. 2013. Production Planning and Control for Semiconductor Wafer Fabrication Facilities. Production Planning and Control for Semiconductor Wafer Fabrication Facilities 29 64 .
Lars Mönch, John W. Fowler & Scott J. MasonLars Mönch, John W. Fowler & Scott J. Mason. 2013. Production Planning and Control for Semiconductor Wafer Fabrication Facilities. Production Planning and Control for Semiconductor Wafer Fabrication Facilities 11 28 .
Lars Mönch, John W. Fowler & Scott J. MasonLars Mönch, John W. Fowler & Scott J. Mason. 2013. Production Planning and Control for Semiconductor Wafer Fabrication Facilities. Production Planning and Control for Semiconductor Wafer Fabrication Facilities 1 10 .
Sang Oh Shim. (2012) Line Level Scheduling by Integrating Area Level Scheduling in Manufacturing Systems. Applied Mechanics and Materials 267, pages 83-86.
Crossref
Tsung-Che Chiang & Li-Chen Fu. (2012) Rule-based scheduling in wafer fabrication with due date-based objectives. Computers & Operations Research 39:11, pages 2820-2835.
Crossref
Hans Ehm & Thomas Ponsignon. (2012) Future research directions for mastering end-to-end semiconductor supply chains. Future research directions for mastering end-to-end semiconductor supply chains.
Thomas Ponsignon & Lars Mönch. (2012) Heuristic approaches for master planning in semiconductor manufacturing. Computers & Operations Research 39:3, pages 479-491.
Crossref
Adrián M. Aguirre, Carlos A. Méndez & Pedro M. Castro. (2011) A novel optimization method to automated wet-etch station scheduling in semiconductor manufacturing systems. Computers & Chemical Engineering 35:12, pages 2960-2972.
Crossref
Lars Mönch, Peter Lendermann, Leon F. McGinnis & Arnd Schirrmann. (2011) A survey of challenges in modelling and decision-making for discrete event logistics systems. Computers in Industry 62:6, pages 557-567.
Crossref
Hans Ehm, Thomas Ponsignon & Thomas Kaufmann. (2011) The global supply chain is our new fab: Integration and automation challenges. The global supply chain is our new fab: Integration and automation challenges.
Hans Ehm, Christian Schiller & Thomas Ponsignon. 2011. Operations Research Proceedings 2010. Operations Research Proceedings 2010 417 422 .
Oleh Sobeyko & Lars Monch. (2010) Genetic algorithms to solve a single machine multiple orders per job scheduling problem. Genetic algorithms to solve a single machine multiple orders per job scheduling problem.
Tsung-Che Chiang, Hsueh-Chien Cheng & Li-Chen Fu. (2010) A memetic algorithm for minimizing total weighted tardiness on parallel batch machines with incompatible job families and dynamic job arrival. Computers & Operations Research 37:12, pages 2257-2269.
Crossref
H-W Kim & D-H Lee. (2009) Heuristic algorithms for re-entrant hybrid flow shop scheduling with unrelated parallel machines. Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture 223:4, pages 433-442.
Crossref
Christoph Habla & Lars Monch. (2008) Solving volume and capacity planning problems in semiconductor manufaturing: A computational study. Solving volume and capacity planning problems in semiconductor manufaturing: A computational study.
Jens Zimmermann, Scott J. Mason, John W. Fowler & Lars Monch. (2008) Determining an appropriate number of FOUPs in semiconductor wafer fabrication facilities. Determining an appropriate number of FOUPs in semiconductor wafer fabrication facilities.
Chen-Fu Chien, Stephane Dauzere-Peres, Hans Ehm, John W. Fowler, Zhibin Jiang, Shekar Krishnaswamy, Lars Monch & Reha Uzsoy. (2008) Modeling and analysis of semiconductor manufacturing in a shrinking world: Challenges and successes. Modeling and analysis of semiconductor manufacturing in a shrinking world: Challenges and successes.
E. Mohebbi. (2008) A note on a production control model for a facility with limited storage capacity in a random environment. European Journal of Operational Research 190:2, pages 562-570.
Crossref
P. J. Byrne, Cathal Heavey & Kamil Erkan Kabak. (2007) An analysis of tool capabilities in the photolithography area of an asic fab. An analysis of tool capabilities in the photolithography area of an asic fab.
Claude Yugma, Romain Riffart, Stephane Dauzere-Peres, Philippe Vialletelle & Francois Buttin. (2007) A dispatcher simulator for a photolithography workshop. A dispatcher simulator for a photolithography workshop.
Mickael Bureau, Stephane Dauzere-Peres, Claude Yugma & Leon Vermarien. (2007) An approach for simulating consistent global and local scheduling. An approach for simulating consistent global and local scheduling.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.