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Integrated Ferroelectrics
An International Journal
Volume 3, 1993 - Issue 4
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Original Articles

Characterization of conduction in PZT thin films produced by laser ablation deposition

X. Chen Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695, U.S.A.
,
A. I. Kingon Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695, U.S.A.
,
L. Mantese Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695, U.S.A.
,
O. Auciello Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695, U.S.A.; Microelectronics Center of North Carolina
&
K. Y. Hsieh Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695, U.S.A.
Pages 355-363 | Received 29 Dec 1992, Accepted 25 Sep 1993, Published online: 19 Aug 2006

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Yu. V. Podgorny, A. N. Antonovich, K. A. Vorotilov & A. S. Sigov. (2019) Discharge currents in dense and porous PZT films. Ferroelectrics 544:1, pages 82-87.
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J. -L. Dellis, I. P. Raevsky, S. I. Raevskaya & L. A. Reznitchenko. (2005) Cole-Cole Analysis of a New Lead Free NaNbO3-Sr0.5NbO3-LiNbO3 Ferroelectric Relaxor. Ferroelectrics 318:1, pages 169-177.
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S. Saha & S.B. Krupanidhi. (2001) AC and DC conductivity studies in pulsed laser ablated (Ba, Sr)TiO3 thin films. Integrated Ferroelectrics 33:1-4, pages 353-361.
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Soon-Gil Yoon, A.I. Kingon & Seung-Hyun Kim. (2001) Electrical properties of Pb1-xLax(ZryTi1-y)1-x/4O3 thin films with various iridium-based top electrodes. Integrated Ferroelectrics 33:1-4, pages 155-164.
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O. Lohse, M. Grossmann, D. Bolten, U. Boettger & R. Waser. (2001) Relaxation mechanisms in ferroelectric thin film capacitors for feram application. Integrated Ferroelectrics 33:1-4, pages 39-48.
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S. Bhattacharyya & S.B. Krupanidhi. (2001) AC electrical property studies on SrBi2(Ta0.5,Nb0.5)2O9 thin films by excimer laser ablation. Integrated Ferroelectrics 32:1-4, pages 101-119.
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J.F. Scott. (1999) A note on the polarization dependence of leakage current in ferroelectric thin film. Integrated Ferroelectrics 23:1-4, pages 187-190.
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M. Schumacher & R. Waser. (1998) Curie - Von Schweidler behaviour observed in ferroelectric thin films and comparison to superparaelectric thin film materials. Integrated Ferroelectrics 22:1-4, pages 109-121.
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Hironori Fujisawa, Masaru Shimizu, Hirohiko Niu, Toshihisa Horiuchi, Tadashi Shiosaki & Kazumi Matsushige. (1997) Simultaneous observation of the surface topography and current flow of PZT thin films using an atomic force microscope. Integrated Ferroelectrics 18:1-4, pages 71-78.
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J.F. Scott & F.M. Ross. (1997) New results on layer-structure perovsktte ferroelectric thin-film memories. Ferroelectrics 201:1, pages 43-53.
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Jung-Won Cha & Jung-Nam Kim. (1997) The study of ferroelectricity and phase transition in Li2B4O7single crystals. Ferroelectrics 197:1, pages 93-96.
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In Kyeong Yoo, Chang Jung Kim & SeshuB. Desu. (1995) Breakdown mechanisms in PZT thin film capacitors. Integrated Ferroelectrics 11:1-4, pages 269-275.
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A.K. Tagantsev, A.L. Kholkin, E.L. Colla, K.G. Brooks & N. Setter. (1995) Effect of ferroelectric polarization on current response of PZT thin films. Integrated Ferroelectrics 10:1-4, pages 189-204.
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GuidoW. Dietz & Rainer Waser. (1995) How to analyse relaxation and leakage currents of dielectric thin films: Simulation of voltage-step and voltage-ramp techniques. Integrated Ferroelectrics 8:3-4, pages 317-332.
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X. Chen, A.I. Kingon, H.N. Al-Shareef, K.R. Bellur, K. Gifford & O. Auciello. (1995) Leakage and interface engineering in titanate thin films for non-volatile ferroelectric memory and ulsi drams. Integrated Ferroelectrics 7:1-4, pages 291-306.
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Articles from other publishers (37)

Rachid Bouregba. (2023) On the origin of polarization fatigue and Curie–von Schweidler relaxation current in Pb(Zrx,Ti1−x)O3 ferroelectric thin films: A unique mechanism based on charge trapping by interface defects. Journal of Applied Physics 133:1.
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Yury V. Podgorny, Alexander N. Antonovich, Alexey A. Petrushin, Alexander S. Sigov & Konstantin A. Vorotilov. (2022) Effect of metal electrodes on the steady-state leakage current in PZT thin film capacitors. Journal of Electroceramics 49:1, pages 15-21.
Crossref
Hamed A. Gatea. (2020) The Effect of Sintering Temperature on the Electrical Properties and Particle Size of the Compound Ferroelectric PZT Prepared by Wet Chemical Methods. IOP Conference Series: Materials Science and Engineering 928:7, pages 072007.
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Qicheng Zhang, Wenping Geng, Jing Zhang, Xiaojun Qiao, Xi Chen, Xueming Fan & Xiujian Chou. (2019) Effect of electrode interfaces on peak-drift switching current of PZT thin films. Ceramics International 45:3, pages 3159-3165.
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L. A. Delimova, E. V. Guschina, D. S. Seregin, K. A. Vorotilov & A. S. Sigov. (2017) Unexpected behavior of transient current in thin PZT films caused by grain-boundary conduction. Journal of Applied Physics 121:22.
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Yury Podgorny, Konstantin Vorotilov & Alexander Sigov. (2016) Estimation of steady-state leakage current in polycrystalline PZT thin films. AIP Advances 6:9.
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Wenbing Hu, Bradley Frost & Rebecca L Peterson. (2016) Thermally stable yttrium–scandium oxide high-k dielectrics deposited by a solution process. Journal of Physics D: Applied Physics 49:11, pages 115109.
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L. A. Delimova, E. V. Gushchina, V. S. Yuferev & I. V. Grekhov. (2014) Investigation of the polarization dependence of the transient current in polycrystalline and epitaxial Pb(Zr,Ti)O3 thin films. Physics of the Solid State 56:12, pages 2451-2460.
Crossref
X P Hu, D W Duan, K Zhang, S Q Chu, J Zhang, Y N Xie, D Guo & J L Cao. (2013) EXAFS study of PZT ferroelectric thin films of different crystallinities. Journal of Physics: Conference Series 430, pages 012093.
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. 2011. Ferroelectric Dielectrics Integrated on Silicon. Ferroelectric Dielectrics Integrated on Silicon 213 279 .
Mohamed-Tahar Chentir, Emilien Bouyssou, Laurent Ventura & Christine Anceau. (2009) Leakage current evolution versus dielectric thickness in lead zirconate titanate thin film capacitors. Journal of Applied Physics 105:6.
Crossref
Jayanta Parui & S. B. Krupanidhi. (2008) Slim P-E hysteresis loop and anomalous dielectric response in sol-gel derived antiferroelectric PbZrO3 thin films. Journal of Applied Physics 104:2.
Crossref
Andrey B. Kozyrev, Vitaly N. Osadchy, Dmitry M. Kosmin, Andrey V. Tumarkin, Tatiana Kaydanova & David Ginley. (2007) Time tuning of ferroelectric film varactors under pulse voltages. Applied Physics Letters 91:2.
Crossref
Dhananjay, J Nagaraju, Palash Roy Choudhury & S B Krupanidhi. (2006) Growth of ferroelectric Li-doped ZnO thin films for metal-ferroelectric-semiconductor FET. Journal of Physics D: Applied Physics 39:13, pages 2664-2669.
Crossref
Neil McN. Alford, Peter Kr. Petrov, Aleksandr G. Gagarin, Andrey B. Kozyrev, Aleksandr I. Sokolov, Oleg I. Soldatenkov & Valery A. Volpyas. (2005) Enhanced electrical properties of ferroelectric thin films by ultraviolet radiation. Applied Physics Letters 87:22.
Crossref
P. Venkateswarlu, Apurba Laha & S.B. Krupanidhi. (2005) AC properties of laser ablated La-modified lead titanate thin films. Thin Solid Films 474:1-2, pages 1-9.
Crossref
Hironori Fujisawa & Masaru Shimizu. 2004. Nanoscale Phenomena in Ferroelectric Thin Films. Nanoscale Phenomena in Ferroelectric Thin Films 219 238 .
In Kyeong Yoo. 2004. Nanoscale Phenomena in Ferroelectric Thin Films. Nanoscale Phenomena in Ferroelectric Thin Films 3 38 .
S Bhattacharyya, S Saha & S.B Krupanidhi. (2002) Investigation of reversible and irreversible polarizations in thin films of SrBi2(Ta0.5,Nb0.5)2O9. Thin Solid Films 422:1-2, pages 155-160.
Crossref
Sandip Halder, Sudipta Bhattacharyya & S.B Krupanidhi. (2002) Electrical characterization of Ba(Zr0.1Ti0.9)O3 thin films grown by pulsed laser ablation technique. Materials Science and Engineering: B 95:2, pages 124-130.
Crossref
Yu. A. Boikov, B. M. Goltsman, V. K. Yarmarkin & V. V. Lemanov. (2002) Near-electrode model of transient currents in (Ba,Sr)TiO3 thin film capacitor structures. Applied Physics Letters 80:21, pages 4003-4005.
Crossref
S. S. N. Bharadwaja, P. Victor, P. Venkateswarulu & S. B. Krupanidhi. (2002) ac transport studies of La-modified antiferroelectric lead zirconate thin films. Physical Review B 65:17.
Crossref
S.S.N. Bharadwaja & S.B. Krupanidhi. (2001) Study of AC electrical properties in multigrain antiferroelectric lead zirconate thin films. Thin Solid Films 391:1, pages 126-132.
Crossref
O. Lohse, M. Grossmann, U. Boettger, D. Bolten & R. Waser. (2001) Relaxation mechanism of ferroelectric switching in Pb(Zr,Ti)O3 thin films. Journal of Applied Physics 89:4, pages 2332-2336.
Crossref
S.S.N Bharadwaja & S.B Krupanidhi. (2000) Dielectric relaxation in antiferroelectric multigrain PbZrO3 thin films. Materials Science and Engineering: B 78:2-3, pages 75-83.
Crossref
S. S. N. Bharadwaja & S. B. Krupanidhi. (2000) Alternating current electrical properties of antiferroelectric lead zirconate thin films by pulsed excimer laser ablation. Journal of Applied Physics 88:4, pages 2072-2080.
Crossref
Oliver Lohse, Michael Grossmann, Dierk Bolten, Ulrich Boettger & Rainer Waser. (2011) Transient Behavior of the Polarization in Ferroelectric Thin Film Capacitors. MRS Proceedings 655.
Crossref
S. Bhattacharyya, S. S. N. Bharadwaja & S. B. Krupanidhi. (2000) Alternating current conduction behavior of excimer laser ablated SrBi[sub 2]Nb[sub 2]O[sub 9] thin films. Journal of Applied Physics 88:7, pages 4294.
Crossref
R. Waser, O. Lohse, M. Grossmann, U. Boettger, D. Bolten & S. Tiedke. (2011) Frequency Dependence of the Coercive Voltage of Ferroelectric Thin Films. MRS Proceedings 596.
Crossref
Tae Song Kim, Dong Joo Kim, Jeon Kook Leea & Hyung Jin Jung. (2011) Structural and electrical properties of excess PbO doped Pb(Zr 0.52 Ti 0.48 )O 3 thin films using rf magnetron sputtering method . Journal of Materials Research 13:12, pages 3436-3441.
Crossref
Y. S. Yang, S. J. Lee, S. H. Kim, B. G. Chae & M. S. Jang. (1998) Schottky barrier effects in the electronic conduction of sol–gel derived lead zirconate titanate thin film capacitors. Journal of Applied Physics 84:9, pages 5005-5011.
Crossref
Hironori Fujisawa, Masaru Shimizu, Toshihisa Horiuchi, Tadashi Shiosaki & Kazumi Matsushige. (1997) Investigation of the current path of Pb(Zr,Ti)O3 thin films using an atomic force microscope with simultaneous current measurement. Applied Physics Letters 71:3, pages 416-418.
Crossref
W. Zhu, Z. Q. Liu, M. S. Tse & H. S. Tan. (1995) Raman, FT-IR and dielectric studies of PZT 40/60 films deposited by MOD technology. Journal of Materials Science: Materials in Electronics 6:6, pages 369-374.
Crossref
Neung-Ho Cho & Ho-Gi Kim. (1995) Structure and electrical properties of Pb(Zr,Ti)O3 thin films deposited by reactive sputtering using multi-targets. Thin Solid Films 266:2, pages 140-144.
Crossref
R. Waser. 1995. Science and Technology of Electroceramic Thin Films. Science and Technology of Electroceramic Thin Films 223 248 .
H.N. Al-Shareef, A.I. Kingon, X. Chen, K.R. Bellur & O. Auciello. (2011) Contribution of electrodes and microstructures to the electrical properties of Pb(Zr 0.53 Ti 0.47 )O 3 thin film capacitors . Journal of Materials Research 9:11, pages 2968-2975.
Crossref
Orlando Auciello, H. N. Al Shareef, K. D. Gifford, D. J. Lichtenwalner, R. Dat, K. R. Bellur, A. I. Kingon & R. Ramesh. (2011) A Review of Orientation-Microstructure-Property Relationships for PZT / Metal or Metal-Oxide Layered Heterostructures. MRS Proceedings 341.
Crossref

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